SMPS Stacked MLC Capacitors
(SM Style) DSCC #87106 and #88011
Table II. Group A inspection.
Requirement
paragraph of
MIL-PRF-49470
Test method
paragraph of
MIL-PRF-49470
Inspection
Sampling procedure
Subgroup 1
Thermal shock and voltage conditioning +ꢀ
±.9
4.8.ꢂ
4.8.4
+005 inspection
Subgroup 2
ꢄisual and mechanical examination:
Material
Physical dimensions
Interface requirements
(other than physical dimensions)
Marking 1ꢀ
±.4
±.+
+± samples
0 failures
±.ꢂ and ±.ꢂ.+
±.18
±.±0
Workmanship
1/ Post checks are required (see paragraph 3.9 of MIL-PRF-49470).
2/ Marking defects are based on visual examination only. Any subsequent electrical defects shall not
be used as a basis for determining marking defects.
Table III. Group B inspection. 1/
Requirement
paragraph of
MIL-PRF-49470
Test method
paragraph of
MIL-PRF-49470
Number of
sample units
to be inspected
Number of
defectives
permitted 2/
Inspection
Subgroup 1 3/
Temperature coefficient
Resistance to solvents ꢂꢀ 6ꢀ
Immersion
4ꢀ
4ꢀ
±.1±
±.+8
±.14
4.8.10
4.8.+ꢂ
4.8.+0
+1
+1
6
+
Terminal strength ꢂꢀ
Subgroup 2
Resistance to soldering heat
Moisture resistance
±.10
±.1+
4.8.+7
4.8.+8
+
+
6ꢀ +
Subgroup 3
Marking legibility
(laser marking only)
±.18.+
4.8.4.+
Subgroup 4
Solderability
±.+ꢂ
±.16
4.8.+1
4.8.11
±
0
0
Subgroup 5
Life
ꢂ minimum
per case code
1/ Unless otherwise specified herein, when necessary, mounting of group B samples shall be at the
discretion of the manufacturer.
2/ A sample unit having one or more defects shall be charged as a single defective.
3/ Order of tests is at discretion of manufacturer.
4/ See 3.2.3 of DSCC 87106.
5/ Sample size shall be 3 pieces with zero defectives permitted.
6/ Total of one defect allowed for combination of subgroup 1, subgroup 2, and subgroup 3 inspections.
21