841N4830 Datasheet
Table 6C. HCSL AC Characteristics, V = 3.0V to 3.6V, V
DD
= 2.7V to 3.6V, T = -40°C to 85°C
A
DDO
Symbol
Parameter
Test Conditions
PLL
Minimum
Typical
Maximum
Units
MHz
MHz
MHz
ps
100
fOUT
Output Frequency
PLL Bypass
20
fREF
Reference Frequency
25
tsk(b)
Bank Skew; NOTE 1, 10
50
Phase Jitter, RMS (Random);
NOTE 11
100MHz, Integration Range:
12kHz – 20MHz
tjit(Ø)
0.36
ps
ps
ps
100MHz, 25MHz crystal input
High Band: 1.5MHz - Nyquist
(clock frequency/2)
tREFCLK_HF_RMS Phase Jitter RMS; NOTE 2
tREFCLK_LF_RMS Phase Jitter RMS; NOTE 2
0.600
0.023
100MHz, 25MHz crystal input
Low Band: 10kHz - 1.5MHz
tjit(cc)
Cycle-to-Cycle Jitter
PLL Lock Time
PLL Mode
30
10
ps
tL
ms
Ring-back Voltage Margin;
NOTE 4, 9
VRB
-100
500
100
mV
ps
Time before VRB is allowed;
NOTE 4, 9
tSTABLE
VHIGH
VLOW
Voltage High
Voltage Low
520
920
150
mV
mV
-150
Absolute Crossing Voltage;
NOTE 3, 6, 7
VCROSS
160
460
140
mV
mV
Total Variation of VCROSS over
all edges; NOTE 3, 6, 8
VCROSS
Rising Edge Rate; NOTE 4, 5
Falling Edge Rate; NOTE 4, 5
0.6
0.6
4.0
4.0
V/ns
V/ns
Power Supply Noise
Reduction
PSNR
odc
-45
dB
%
Output Duty Cycle; NOTE 4
49
51
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
NOTE 1: Defined as skew within a bank of outputs at the same voltage and with equal load conditions.
NOTE 2: RMS jitter after applying the two evaluation bands to the two transfer functions defined in the Common Clock Architecture and
reporting the worst case results for each evaluation band. Maximum limit for PCI Express Generation 2 is 3.1ps RMS for tREFCLK_HF_RMS
(High Band) and 3.0ps RMS for tREFCLK_LF_RMS (Low Band). See IDT Application Note PCI Express Reference Clock Requirements and also
the PCI Express Application section of this datasheet which show each individual transfer function and the overall composite transfer function.
NOTE 3: Measurement taken from single ended waveform.
NOTE 4: Measurement taken from differential waveform.
NOTE 5: Measured from -150mV to +150mV on the differential waveform (derived from Q minus nQ). The signal must be monotonic through
the measurement region for rise and fall time. The 300mV measurement window is centered on the differential zero crossing.
NOTE 6: Measured at the crosspoint where the instantaneous voltage value of the rising edge of Q equals the falling edge of nQ.
NOTE 7: Refers to the total variation from the lowest crosspoint to the highest, regardless of which edge is crossing. Refers to all crosspoints
for this measurement.
NOTE 8: Defined as the total variation of all crossing voltages of rising Q and falling nQ, This is the maximum allowed variance in VCROSS for
any particular system.
NOTE 9: TSTABLE is the time the differential clock must maintain a minimum 150mV differential voltage after rising/falling edges before it is
allowed to drop back into the VRB 100mV differential range.
NOTE 10: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 11: See Phase Noise Plot.
©2016 Integrated Device Technology, Inc.
7
Revision F, May 23, 2016