IDT6116SA/LA
CMOS Static RAM 2K (16K x 8-Bit)
Military, Commercial, and Industrial Temperature Ranges
DCElectricalCharacteristics(1)(continued)
(VCC = 5.0V ± 10%, VLC = 0.2V, VHC = VCC - 0.2V)
6116SA45
6116LA45
6116SA55
6116LA55
6116SA70
6116LA70
6116SA90
6116LA90
6116SA120
6116LA120
6116SA150
6116LA150
Com'l
& Ind
Symbol
Parameter
Power
Mil
Mil Only
Mil Only
Mil Only
Mil Only
Mil Only
Unit
I
CC1
Operating Power Supply
mA
SA
100
90
90
90
90
90
90
Current, CS < VIL
Outputs Open
CC = Max., f
,
LA
SA
LA
SA
LA
95
100
90
85
100
95
85
100
90
85
100
90
85
100
85
85
100
85
85
90
85
25
15
V
= 0
ICC2
Dynamic Operating
Current, CS < VIL
Outputs Open
CC = Max., f = fMAX
mA
mA
mA
,
(2)
V
ISB
Standby Power Supply
Current (TTL Level)
25
25
25
25
25
25
CS > VIH, Outputs Open
(2)
20
20
20
20
25
15
V
CC = Max., f = fMAX
ISB1
Full Standby Power
Supply Current (CMOS
SA
LA
2
10
10
10
10
10
10
Level), CS > VHC
CC = Max., VIN < VLC
or VIN > VHC, f = 0
,
V
0.1
0.9
0.9
0.9
0.9
0.9
0.9
3089 tbl 09
NOTES:
1. All values are maximum guaranteed values.
2. fMAX = 1/tRC, only address inputs are toggling at fMAX, f = 0 means address inputs are not changing.
Data Retention Characteristics Over All Temperature Ranges
(LA Version Only) (VLC = 0.2V, VHC = VCC – 0.2V)
Typ.(1)
Max.
VCC @
VCC @
Symbol
Parameter
Test Condition
Min.
2.0V
3.0V
2.0V
3.0V
Unit
V
____
____
____
____
____
V
DR
V
CC for Data Retention
2.0
____
____
Data Retention Current
MIL.
COM'L.
0.5
0.5
1.5
1.5
200
20
300
30
µA
ICCDR
(3)
CDR
____
____
____
____
CS > VHC
IN > VHC or < VLC
t
Chip Deselect to Data
Retention Time
0
ns
ns
V
____
____
____
____
____
____
(3)
(2)
Operation Recovery Time
Input Leakage Current
t
R
t
RC
____
2
2
µA
IILII
3089 tbl 10
NOTES:
1. TA = + 25°C
2. tRC = Read Cycle Time.
3. This parameter is guaranteed by device characterization, but is not production tested.
4