TVS Diodes
Axial Leaded – 5000W > 5KP-HR series
Screen Process
100%Vision Inspection
MIL-STD-750 method 2074
MIL-STD-750 method 1031
MIL-STD-750 method 1051
MIL-STD-750 method 4066
100% HighTemperature Storage Life (168hrs,175°C)
100%Temperature CycleTest (-55 to150°C, 20 cycles, dwell time 15 min)
100% SurgeTest (2x)
100% HTRB 150°C Bias=VR(80% breakdown voltage, 96hrs, and each direction
at 96 hrs for Bi-directional products)
MIL-STD-750 method 1038
Final ElectricalTest( 100% 3 sigma limit, 100% dynamic test and PAT limit)
MIL-STD-750 method 4016.4021.4011
Note: Up-screen program can be specified by customer’s request via contacting Littelfuse service
Group BTest Requirement
Screen
Method
Condition
Requirement
Maximum clamping
Voltage (VC) @ Peak
Plus Current (IPP)
Sample Size 45 perform 10x
Accept 0 failures
10/1000 µs Peak
Pluse Waveform
Surge test
Sample size 45
340 hours (680 hours for bi-
direction products, each direction
340 hours)
Applied voltage
100% VR@150°C
Burn - In
(HTRB)
MIL-STD-750,
Method 1038.5
Accept 0 failures
Sample size 45
Accept 0 failures
Electrical test
--
IR@VR, V(BR)@IT
I-V Curve Characteristics
Bi-directional
Uni-directional
Ipp
IT
IR
Vc VBR
VR
V
Vc VBR
VR
IR
IT
V
VRVBR Vc
IR
IT
VF
Ipp
Ipp
PPPM Peak Pulse Power Dissipation -- Max power dissipation
VR Stand-off Voltage -- Maximum voltage that can be applied to theTVS without operation
VBR Breakdown Voltage -- Maximum voltage that flows though theTVS at a specified test current (IT)
VC Clamping Voltage -- Peak voltage measured across theTVS at a specified Ippm (peak impulse current)
IR Reverse Leakage Current -- Current measured at VR
VF Forward Voltage Drop for Uni-directional
© 2016 Littelfuse, Inc.
Specifications are subject to change without notice.
Revised: 09/10/16