LM136A-2.5 Electrical Characteristics
DC Parameters
The following conditions apply, unless otherwise specified. IR = 1mA
Sub-
groups
Symbol
IAdj
Parameter
Adjust Current
Conditions
VAdj = 0.7V
Notes
Min Max
Unit
-125 +125
6.0
µA
mV
mV
V
1, 2, 3
1
Delta VZ
Delta Zener Voltage
0.4mA ≤ IZ ≤ 10 mA
10
2, 3
1
VZ
Zener Voltage
VAdj = Open
2.465 2.515
2.44 2.54
2.39 2.49
2.29 2.49
2.49 2.69
0.6
V
2, 3
1
VAdj = 0.7V
VAdj = 1.9V
V
V
2, 3
1, 2, 3
1
V
ZRD
Reverse Dynamic Impedance
Temperature Stability
(Note 4)
(Note 4)
Ω
Ω
1.0
2, 3
2, 3
VStab
VZ = Adjusted to 2.490V
18
mV
DC Drift Parameters
Delta calculations are performed on QMLV devices at Group B, Subgroup 5 only.
Symbol Parameter Conditions
VZ Zener Voltage VAdj = Open
Sub-
groups
Notes
Min Max
Unit
−10 +10
−10 +10
−10 +10
mV
mV
mV
1
1
1
VAdj = 0.7V
VAdj = 1.9V
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed
specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test
conditions.
Note 2: The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature), θJA (package
junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any temperature is PDmax = (TJmax - TA)/
θ
JA or the number given in the Absolute Maximum Ratings, whichever is lower.
Note 3: Human body model, 1.5KΩ in series with 100pF.
Note 4: Parameter tested go-no-go only.
Note 5: Pre and post irradiation limits are identical to those listed under DC electrical characteristics. These parts may be dose rate sensitive in a space
environment and may demonstrate enhanced low dose rate effect. Radiation end point limits for the noted parameters are guaranteed only for the conditions as
specified in Mil-Std-883, Method 1019.
Note 6: Low dose rate testing has been performed on a wafer-by-wafer basis, per test method 1019 condition D of MIL-STD-883, with no enhanced low dose
rate sensitivity (ELDRS) effect.
5
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