Datasheet > 5962F0053801V9X

5962F0053801V9X

更新时间： 2024-01-29 05:16:55

品牌	Logo	应用领域
ACTEL		/
页数	文件大小	规格书
217页	1554K
描述
IC SPECIALTY MICROPROCESSOR CIRCUIT, Microprocessor IC:Other

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技术参数
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5962F0053801V9X 技术参数

生命周期：	Transferred	包装说明：	,
Reach Compliance Code：	compliant	HTS代码：	8542.31.00.01
风险等级：	5.12	认证状态：	Not Qualified
技术：	CMOS	总剂量：	300k Rad(Si) V
uPs/uCs/外围集成电路类型：	MICROPROCESSOR CIRCUIT	Base Number Matches：	1

5962F0053801V9X 数据手册

浏览型号5962F0053801V9X的Datasheet PDF文件第209页

浏览型号5962F0053801V9X的Datasheet PDF文件第210页

浏览型号5962F0053801V9X的Datasheet PDF文件第211页

浏览型号5962F0053801V9X的Datasheet PDF文件第213页

浏览型号5962F0053801V9X的Datasheet PDF文件第214页

浏览型号5962F0053801V9X的Datasheet PDF文件第215页

MIL-PRF-38535K

INDEX

PARAGRAPH

Responsibility for inspection

Resubmission of failed lots

Revalidation reviews

Rework

A.4.1

A.4.3.3.1

3.4.7

6.4.10

A.3.1.3.16

A.3.7.1

3.6.2.1

A.3.6.2.2

C.3.6

C.3.3

C.3.4

A.4.4.2.1.1

D.4.2.1

A.4.3.2

A.3.5.4.4

A.4.8.1.1.13

1.1

Rework

Rework provisions

RHA designator

RHA packages

RHA QM plan

RHA/QML certification requirements

Sample

Sample size

Sampling

Schematic diagrams

Schematics

Scope

SCOPE

A.1

Scope

A.1.1

SCOPE

B.1

Scope

B.1.1

SCOPE

C.1

Scope

C.1.1

D.1

SCOPE

Scope

D.1.1

F.1

SCOPE

Scope

F.1.1

SCOPE

G.1

SCOPE

H.1

SCOPE

J.1

Scope

J.1.1

Screen testing failures

Screening

4.2.1

4.2

Screening

A.3.4.3

A.4.6

Screening

B.4.1

Screening

F.4.6

Screening and test

3.8

Screening resubmission criteria

Screening test data for class level S microcircuits

Seal (fine and gross leak) testing

Second and third party validations

Selection of samples

4.2.2

A.4.7.1

J.3.7

3.4.1.3.1

D.4.1.1

198

1...209 210 211212213 214 215...217

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