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5962D9569202VEC PDF预览

5962D9569202VEC

更新时间: 2024-02-04 12:10:26
品牌 Logo 应用领域
英特矽尔 - INTERSIL 复用器
页数 文件大小 规格书
6页 168K
描述
Radiation Hardened Single 8/Differential 4-Channel CMOS Analog Multiplexers

5962D9569202VEC 技术参数

生命周期:Obsolete包装说明:DIP,
Reach Compliance Code:unknownHTS代码:8542.39.00.01
风险等级:5.83模拟集成电路 - 其他类型:DIFFERENTIAL MULTIPLEXER
JESD-30 代码:R-CDIP-T16长度:19.05 mm
负电源电压最大值(Vsup):-22 V标称负供电电压 (Vsup):-15 V
信道数量:4功能数量:1
端子数量:16标称断态隔离度:50 dB
最大通态电阻 (Ron):400 Ω最高工作温度:125 °C
最低工作温度:-55 °C封装主体材料:CERAMIC, METAL-SEALED COFIRED
封装代码:DIP封装形状:RECTANGULAR
封装形式:IN-LINE认证状态:Not Qualified
座面最大高度:5.08 mm最大供电电压 (Vsup):22 V
标称供电电压 (Vsup):15 V表面贴装:NO
最长断开时间:1000 ns最长接通时间:1000 ns
技术:CMOS温度等级:MILITARY
端子形式:THROUGH-HOLE端子节距:2.54 mm
端子位置:DUAL总剂量:10k Rad(Si) V
宽度:7.62 mmBase Number Matches:1

5962D9569202VEC 数据手册

 浏览型号5962D9569202VEC的Datasheet PDF文件第1页浏览型号5962D9569202VEC的Datasheet PDF文件第2页浏览型号5962D9569202VEC的Datasheet PDF文件第3页浏览型号5962D9569202VEC的Datasheet PDF文件第5页浏览型号5962D9569202VEC的Datasheet PDF文件第6页 
HS-0508RH, HS-0509RH  
Burn-In/Life Test Circuits  
V1  
F0  
F3  
F1  
F2  
1
2
3
4
5
6
7
8
16  
15  
14  
13  
12  
11  
10  
9
1
2
3
4
5
6
7
8
16  
15  
14  
13  
12  
11  
10  
9
V1  
D1  
V2  
D1  
V2  
V3  
C1  
C1  
D2  
C2  
D2  
C2  
R1  
R1  
HS-0508RH  
DYNAMIC BURN-IN AND LIFE TEST CIRCUIT  
HS-0508RH  
STATIC BURN-IN TEST CIRCUIT  
V1 = -15V maximum, -16V minimum  
V2 = +15V minimum, +16V maximum  
R1 = 10kΩ ±5% 1/4W  
V1 = 5V minimum, 6V maximum  
V2 = -15V maximum, -16V minimum  
V3 = +15V minimum, +16V maximum  
R1 = 10kΩ ±5% 1/4W  
C1 = C2 = 0.01µF minimum (per socket) or 0.1µF minimum (per row)  
D1 = D2 = 1N4002 (or equivalent)  
C1 = C2 = 0.01µF minimum (per socket) or 0.1µF minimum (per row)  
F0 = 100kHz 50% duty cycle; VIL = 0.8V max; VIH = 4.0V min.  
D1 = D2 = 1N4002 (or equivalent)  
F1 = F0/2  
F2 = F1/2  
F3 = F2/2  
F0  
F2  
F1  
V1  
1
2
3
4
5
6
7
8
16  
15  
14  
13  
12  
11  
10  
9
1
2
3
4
5
6
7
8
16  
15  
14  
13  
12  
11  
10  
9
V3  
V2  
V3  
V2  
D1  
C1  
D1  
C1  
D1  
C1  
D1  
C1  
R1  
R1  
R1  
R1  
HS-0509RH  
DYNAMIC BURN-IN AND LIFE TEST CIRCUIT  
HS-0509RH  
STATIC BURN-IN TEST CIRCUIT  
V2 = +15.5V, ±.0.5V  
V1 = +5.5V, ±0.5V  
V3 = -15.5V, ±0.5V  
V2 = +15.5V, ±0.5V  
R1 = 10k, ±5%  
V3 = -15.5V, ±0.5V  
C1 = 0.1µF minimum (per socket)  
D1 = 1N4002 or equivalent (per board)  
F0 = 100kHz, ±10%; F1 = F0/2; F2 = F1/2, 50% duty cycle,  
VIL = 0.8V max.; VIH = 4.0V min.  
R1 = 10k, ±10%  
C1 = 0.1µF minimum (per socket)  
D1 = 1N4002 or equivalent (per board)  
4

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