Datasheet > 5962-9958603QXX

5962-9958603QXX

更新时间： 2024-01-28 21:01:00

品牌	Logo	应用领域
ACTEL		栅可编程逻辑
页数	文件大小	规格书
27页	303K
描述
Field Programmable Gate Array, 32000 Gates, CMOS, CQFP256, CERAMIC, QFP-256

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5962-9958603QXX 技术参数

生命周期：	Obsolete	包装说明：	CERAMIC, QFP-256
Reach Compliance Code：	unknown	风险等级：	5.8
其他特性：	IT CAN ALSO OPERATES 5V SUPPLY ALSO	JESD-30 代码：	S-CQFP-F256
长度：	36 mm	等效关口数量：	32000
端子数量：	256	最高工作温度：	125 °C
最低工作温度：	-55 °C	组织：	32000 GATES
封装主体材料：	CERAMIC, METAL-SEALED COFIRED	封装代码：	QFF
封装形状：	SQUARE	封装形式：	FLATPACK
可编程逻辑类型：	FIELD PROGRAMMABLE GATE ARRAY	认证状态：	Not Qualified
筛选级别：	MIL-PRF-38535 Class Q	座面最大高度：	3.81 mm
最大供电电压：	3.6 V	最小供电电压：	3 V
标称供电电压：	3.3 V	表面贴装：	YES
技术：	CMOS	温度等级：	MILITARY
端子形式：	FLAT	端子节距：	0.5 mm
端子位置：	QUAD	宽度：	36 mm
Base Number Matches：	1

5962-9958603QXX 数据手册

2.2 Non-Government publications. The following document(s) form a part of this document to the extent specified herein.

Unless otherwise specified, the issues of the documents which are DoD adopted are those listed in the issue of the DoDISS

cited in the solicitation. Unless otherwise specified, the issues of documents not listed in the DoDISS are the issues of the

documents cited in the solicitation.

AMERICAN SOCIETY FOR TESTING AND MATERIALS (ASTM)

ASTM Standard F1192M-95 -Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by

Heavy Ion Irradiation of Semiconductor Devices.

(Applications for copies of ASTM publications should be addressed to the American Society for Testing and Materials,

1916 Race Street, Philadelphia, PA 19103.)

ELECTRONICS INDUSTRIES ASSOCIATION (EIA)

JEDEC Standard EIA/JESD78

IC Latch-Up Test.

(Applications for copies should be addressed to the Electronics Industries Association, 2500 Wilson Boulevard, Arlington,

VA 22201.)

(Non-Government standards and other publications are normally available from the organizations that prepare or distribute

the documents. These documents also may be available in or through libraries or other informational services.)

2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text

of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless

a specific exemption has been obtained.

3. REQUIREMENTS

3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with

MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The

modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for

device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified

herein.

3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified

in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.

3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.

3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.

3.2.3 Truth table(s).

3.2.3.1 Unprogrammed devices. The truth table or test vectors for unprogrammed devices for contracts involving no altered

item drawing is not part of this drawing. When required in screening (see 4.2 herein) or qualification conformance inspection,

groups A, B, C, D, or E (see 4.4 herein), the devices shall be programmed by the manufacturer prior to test. A minimum of 50

percent of the total number of logic modules shall be utilized or at least 25 percent of the total logic modules shall be utilized for

any altered item drawing pattern.

3.2.3.2 Programmed devices. The truth table or test vectors for programmed devices shall be as specified by an attached

altered item drawing.

3.2.4 Switching test circuit and waveforms. The switching test circuit and waveforms diagram shall be as specified on

figure 3.

3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the

electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full

case operating temperature range.

SIZE

STANDARD

5962-99586

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

SHEET

DSCC FORM 2234

APR 97

1 2 345 6 7...27

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与5962-9958603QXX相关器件

型号	品牌	描述	获取价格	数据表
5962-9958603QYC	ACTEL	Field Programmable Gate Array, 32000 Gates, CMOS, CQFP208, CERAMIC, QFP-208	获取价格
5962-9958901QXX	WEDC	IC LIQUID CRYSTAL DISPLAY DRIVER, UUC464, TCP-464, Display Driver	获取价格
5962-9959001QXC	WEDC	Liquid Crystal Driver, 200-Segment, CMOS, TCP-200	获取价格
5962-9959001QXX	WEDC	IC LIQUID CRYSTAL DISPLAY DRIVER, UUC200, TCP-200, Display Driver	获取价格
5962-9959101Q2A	TI	TRIPLE PROCESSOR SUPERVISORS	获取价格
5962-9959101QPA	TI	TRIPLE PROCESSOR SUPERVISORS	获取价格

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