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5962-9958603QXX PDF预览

5962-9958603QXX

更新时间: 2024-02-23 13:07:03
品牌 Logo 应用领域
ACTEL 可编程逻辑
页数 文件大小 规格书
27页 303K
描述
Field Programmable Gate Array, 32000 Gates, CMOS, CQFP256, CERAMIC, QFP-256

5962-9958603QXX 技术参数

生命周期:Obsolete包装说明:CERAMIC, QFP-256
Reach Compliance Code:unknown风险等级:5.8
其他特性:IT CAN ALSO OPERATES 5V SUPPLY ALSOJESD-30 代码:S-CQFP-F256
长度:36 mm等效关口数量:32000
端子数量:256最高工作温度:125 °C
最低工作温度:-55 °C组织:32000 GATES
封装主体材料:CERAMIC, METAL-SEALED COFIRED封装代码:QFF
封装形状:SQUARE封装形式:FLATPACK
可编程逻辑类型:FIELD PROGRAMMABLE GATE ARRAY认证状态:Not Qualified
筛选级别:MIL-PRF-38535 Class Q座面最大高度:3.81 mm
最大供电电压:3.6 V最小供电电压:3 V
标称供电电压:3.3 V表面贴装:YES
技术:CMOS温度等级:MILITARY
端子形式:FLAT端子节距:0.5 mm
端子位置:QUAD宽度:36 mm
Base Number Matches:1

5962-9958603QXX 数据手册

 浏览型号5962-9958603QXX的Datasheet PDF文件第1页浏览型号5962-9958603QXX的Datasheet PDF文件第2页浏览型号5962-9958603QXX的Datasheet PDF文件第4页浏览型号5962-9958603QXX的Datasheet PDF文件第5页浏览型号5962-9958603QXX的Datasheet PDF文件第6页浏览型号5962-9958603QXX的Datasheet PDF文件第7页 
1.3 Absolute maximum ratings. 2/  
3.3 V DC supply voltage range (VCCA, and VCCI ).......................................... -0.3 V dc to +4.0 V dc  
5.0 V DC supply voltage range (VCCR).......................................................... -0.3 V dc to +6.0 V dc  
Input voltage range (VI) ................................................................................ -0.5 V dc to +5.5 V dc  
Output voltage range (VO) ............................................................................ -0.5 V dc to +3.6 V dc  
I/O source sink current (IIO) .......................................................................... -30 to +5.0 mA  
Storage temperature range (TSTG)................................................................ -40 C to +125 C  
Lead temperature (soldering, 10 seconds)................................................... 300 C  
Thermal resistance, junction-to-case ( JC):  
Case X........................................................................................................ 8 C/W 3/  
Case Y........................................................................................................ 9 C/W 3/  
Maximum junction temperature (TJ).............................................................. +150 C  
1.4 Recommended operating conditions.  
10% VCC  
)
3.3V Power supply (VCCA, and VCCI) ............................................................. +3.0 V dc to +3.6 V dc (  
5.0V Power supply (VCCR)............................................................................. +4.5 V dc to +5.5 V dc ( 10% VCC  
)
Case operating temperature range (TC) ....................................................... -55 C to +125 C  
1.5 Digital logic testing for device classes Q and V.  
Fault coverage measurement of manufacturing  
logic tests (MIL-STD-883, test method 5012)............................................. 100 percent 4/  
2. APPLICABLE DOCUMENTS  
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a  
part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in  
the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the  
solicitation.  
SPECIFICATION  
DEPARTMENT OF DEFENSE  
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.  
STANDARDS  
DEPARTMENT OF DEFENSE  
MIL-STD-883  
-
Test Method Standard Microcircuits.  
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.  
HANDBOOKS  
DEPARTMENT OF DEFENSE  
MIL-HDBK-103 - List of Standard Microcircuit Drawings.  
MIL-HDBK-780 - Standard Microcircuit Drawings.  
(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization  
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)  
2/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the  
maximum levels may degrade performance and affect reliability.  
3/ When the thermal resistance for this case is specified in MIL-STD-1835, that value shall supersede the value indicated  
herein.  
4/ 100 percent test coverage of blank programmable logic devices.  
SIZE  
STANDARD  
5962-99586  
A
MICROCIRCUIT DRAWING  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
B
SHEET  
3
DSCC FORM 2234  
APR 97  

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