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5962-8863404UC PDF预览

5962-8863404UC

更新时间: 2023-01-03 03:50:52
品牌 Logo 应用领域
XICOR 可编程只读存储器电动程控只读存储器电可擦编程只读存储器
页数 文件大小 规格书
21页 196K
描述
EEPROM, 32KX8, 90ns, Parallel, CMOS, CPGA28

5962-8863404UC 数据手册

 浏览型号5962-8863404UC的Datasheet PDF文件第5页浏览型号5962-8863404UC的Datasheet PDF文件第6页浏览型号5962-8863404UC的Datasheet PDF文件第7页浏览型号5962-8863404UC的Datasheet PDF文件第9页浏览型号5962-8863404UC的Datasheet PDF文件第10页浏览型号5962-8863404UC的Datasheet PDF文件第11页 
TABLE I. Electrical performance characteristics - Continued.  
Conditions  
-55°C TC +125°C  
SS = 0 V, 4.5 V < VCC < 5.5 V,  
Group A  
subgroups  
Device  
type  
Limits  
Unit  
Test  
Symbol  
V
unless otherwise specified 1/  
Min  
12  
Max  
High voltage  
VH  
See figure 4 5/  
9, 10, 11  
9, 10, 11  
9, 10, 11  
All  
All  
All  
13  
V
Chip erase  
tWLWH2  
tWLWH1  
210  
ms  
ms  
10  
WE pulse width for  
chip erase  
1/ DC and read mode.  
2/ Connect all address inputs and OE to VIH and measure IOLZ and IOHZ with the output under test connected to VOUT  
3/ All pins not being tested are to be open.  
.
4/ Tested initially and after any design or process changes that affect that parameter, and therefore shall be guaranteed to the  
limits specified in table I.  
5/ Tested by application of specified timing signals and conditions, including:  
Equivalent ac test conditions for all device types:  
Output load: 1 TTL gate and CL = 100 pF (minimum) or equivalent circuit.  
Input rise and fall times < 10 ns.  
Timing measurements reference levels:  
Inputs 1.0 V and 2.0 V.  
Input pulse levels: 0.4 V and 2.4 V.  
Outputs 0.8 V and 2.0 V.  
3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an  
approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to  
listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-38535,  
appendix A and the requirements herein.  
3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with  
each lot of microcircuits delivered to this drawing.  
3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing.  
3.9 Verification and review. DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's  
facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the  
reviewer.  
3.10 Processing EEPROMS. All testing requirements and quality assurance provisions herein shall be satisfied by the  
manufacturer prior to delivery.  
3.10.1 Erasure of EEPROMS. When specified, devices shall be erased in accordance with the procedures and characteristics  
specified by the manufacturer.  
3.10.2 Programmability of EEPROMS. When specified, devices shall be programmed to the specified pattern using the  
procedures and characteristics specified by the manufacturer and shall be made available upon request.  
3.10.3 Verification of erasure or programmability of EEPROMS. When specified, devices shall be verified as either  
programmed to the specified pattern or erased. As a minimum, verification shall consist of performing a read of the entire array  
to verify that all bits are in the proper state. Any bit that does not verify to be in the proper state shall constitute a device failure,  
and shall be removed from the lot or sample.  
SIZE  
STANDARD  
5962-88634  
MICROCIRCUIT DRAWING  
A
REVISION LEVEL  
F
SHEET  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43218-3990  
8
DSCC FORM 2234  
APR 97  

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