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5962-8515515RA PDF预览

5962-8515515RA

更新时间： 2024-01-05 14:30:12
品牌 Logo 应用领域
德州仪器 - TI 可编程逻辑器件输入元件时钟
页数 文件大小 规格书
23页 232K
描述
HIGH-PERFORMANCE IMPACT-X E PAL CIRCUITS

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5962-8515515RA 技术参数

生命周期：Obsolete零件包装代码：DFP
包装说明：DFP,针数：20
Reach Compliance Code：unknownECCN代码：3A001.A.2.C
HTS代码：8542.39.00.01风险等级：5.68
Is Samacsys：N最大时钟频率：56 MHz
JESD-30 代码：R-CDFP-F20JESD-609代码：e0
专用输入次数：8I/O 线路数量：2
端子数量：20最高工作温度：125 °C
最低工作温度：-55 °C组织：8 DEDICATED INPUTS, 2 I/O
输出函数：REGISTERED封装主体材料：CERAMIC, METAL-SEALED COFIRED
封装代码：DFP封装形状：RECTANGULAR
封装形式：FLATPACK可编程逻辑类型：OT PLD
传播延迟：12 ns认证状态：Not Qualified
筛选级别：MIL-STD-883最大供电电压：5.5 V
最小供电电压：4.5 V标称供电电压：5 V
表面贴装：YES温度等级：MILITARY
端子面层：TIN LEAD端子形式：FLAT
端子位置：DUALBase Number Matches：1

5962-8515515RA 数据手册

 浏览型号5962-8515515RA的Datasheet PDF文件第14页浏览型号5962-8515515RA的Datasheet PDF文件第15页浏览型号5962-8515515RA的Datasheet PDF文件第16页浏览型号5962-8515515RA的Datasheet PDF文件第18页浏览型号5962-8515515RA的Datasheet PDF文件第19页浏览型号5962-8515515RA的Datasheet PDF文件第20页 
TIBPAL16R4-10C, TIBPAL16R6-10C, TIBPAL16R8-10C  
HIGH-PERFORMANCE IMPACT-X PAL CIRCUITS  
SRPS017 – D3023, MAY 1987 – REVISED MARCH 1992  
By using the described test circuit, MTBF can be determined for several different values of ∆t (see Figure 4).  
Plotting this information on semilog scale demonstrates the metastable characteristics of the selected flip-flop.  
Figure 6 shows the results for the TIBPAL16’-10C operating at 1 MHz.  
9
8
7
6
5
4
3
2
1
10  
10  
10  
10  
10  
10  
10  
10  
10  
10 yr  
1 yr  
1 mo  
1 wk  
1 day  
1 hr  
1 min  
10 s  
f
f
= 1 MHz  
clk  
= 500 kHz  
data  
0
10  
20  
30  
40  
50  
60  
70  
∆t (ns)  
Figure 6. Metastable Characteristics  
From the data taken in the above experiment, an equation can be derived for the metastable characteristics at  
other clock frequencies.  
1
(
C2 x t)  
The metastable equation:  
f
x f  
x C1 e  
SCLK  
data  
MTBF  
The constants C1 and C2 describe the metastable characteristics of the device. From the experimental data,  
–7  
these constants can be solved for: C1 = 9.15 X 10 and C2 = 0.959  
Therefore  
1
7
( 0.959 x t)  
f
x f  
x 9.15 x 10  
e
SCLK  
data  
MTBF  
definition of variables  
DUT (Device Under Test): The DUT is a 10-ns registered PLD programmed with the equation Q : = D.  
MTBF (Mean Time Between Failures): The average time (s) between metastable occurrences that cause a  
violation of the device specifications.  
f
f
(system clock frequency): Actual clock frequency for the DUT.  
SCLK  
(data frequency): Actual data frequency for a specified input to the DUT.  
data  
C1: Calculated constant that defines the magnitude of the curve.  
C2: Calculated constant that defines the slope of the curve.  
t
(metastability recovery time): Minimum time required to guarantee recovery from metastability, at a given  
rec  
MTBF failure rate. t  
= ∆t –  
(CLK to Q, max)  
rec  
tpd  
∆t: The time difference (ns) from when the synchronizing flip-flop is clocked to when its output is sampled.  
The test described above has shown the metastable characteristics of the TIBPAL16R4/R6/R8-10C series. For  
additional information on metastable characteristics of Texas Instruments logic circuits, please refer to TI  
Applications publication SDAA004, ”Metastable Characteristics, Design Considerations for ALS, AS, and LS  
Circuits.’’  
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
17  
1...14151617181920...23

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