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5962-0151101QXC PDF预览

5962-0151101QXC

更新时间: 2024-01-02 07:15:54
品牌 Logo 应用领域
艾法斯 - AEROFLEX 内存集成电路静态存储器
页数 文件大小 规格书
14页 138K
描述
UT9Q512K32 16Megabit SRAM MCM

5962-0151101QXC 技术参数

生命周期:Obsolete零件包装代码:QFP
包装说明:GQFF,针数:68
Reach Compliance Code:unknownECCN代码:3A001.A.2.C
HTS代码:8542.32.00.41风险等级:5.8
Is Samacsys:N最长访问时间:25 ns
其他特性:8 AND 16 BIT OPERATION IS ALSO POSSIBLE备用内存宽度:24
JESD-30 代码:S-CQFP-F68JESD-609代码:e0/e4
长度:22.352 mm内存密度:16777216 bit
内存集成电路类型:SRAM MODULE内存宽度:32
功能数量:1端子数量:68
字数:524288 words字数代码:512000
工作模式:ASYNCHRONOUS最高工作温度:125 °C
最低工作温度:-40 °C组织:512KX32
封装主体材料:CERAMIC, METAL-SEALED COFIRED封装代码:GQFF
封装形状:SQUARE封装形式:FLATPACK, GUARD RING
并行/串行:PARALLEL认证状态:Not Qualified
筛选级别:MIL-PRF-38535 Class T座面最大高度:5.2324 mm
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:YES
技术:CMOS温度等级:AUTOMOTIVE
端子面层:TIN LEAD/GOLD端子形式:FLAT
端子节距:1.27 mm端子位置:QUAD
宽度:22.352 mmBase Number Matches:1

5962-0151101QXC 数据手册

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WRITE CYCLE  
TYPICAL RADIATION HARDNESS  
A combination of Wn less than VIL(max) and En less than  
VIL(max) defines a write cycle. The state of G is a “don’t care”  
The UT9Q512K32 SRAM incorporates features which allows  
operation in a limited radiation environment.  
for a write cycle. The outputs are placed in the high-impedance  
state when eitherG is greater than V IH(min), or when Wn is less  
Table 2. Radiation Hardness  
Design Specifications1  
than V (max).  
IL  
Total Dose  
50  
krad(Si)  
Write Cycle 1, the Write Enable-controlled Access is defined  
by a write terminated byWn going high, with En still active.  
The write pulse width is defined by tWLWH when the write is  
Heavy Ion  
Error Rate2  
<1E-8  
Errors/Bit-Day  
initiated byWn, and by tETWH when the write is initiated byEn.  
Unless the outputs have been previously placed in the high-  
impedance state byG, the user must wait t WLQZ before applying  
Notes:  
1. The SRAM will not latchup during radiation exposure under recommended  
operating conditions.  
2. 90% worst case particle environment, Geosynchronous orbit, 100 mils of  
Aluminum.  
data to the nine bidirectional pins DQ(7:0) to avoid bus  
contention.  
Write Cycle 2, the Chip Enable-controlled Access is defined by  
a write terminated by the latter of En going inactive. The write  
pulse width is defined by tWLEF when the write is initiated by  
Wn, and by tETEF when the write is initiated by the En going  
active. For theWn initiated write, unless the outputs have been  
previously placed in the high-impedance state byG, the user  
must wait tWLQZ before applying data to the eight bidirectional  
pins DQ(7:0) to avoid bus contention.  
3

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