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54ABT16373WQML PDF预览

54ABT16373WQML

更新时间: 2024-02-05 02:46:38
品牌 Logo 应用领域
美国国家半导体 - NSC 锁存器
页数 文件大小 规格书
6页 120K
描述
暂无描述

54ABT16373WQML 数据手册

 浏览型号54ABT16373WQML的Datasheet PDF文件第1页浏览型号54ABT16373WQML的Datasheet PDF文件第2页浏览型号54ABT16373WQML的Datasheet PDF文件第4页浏览型号54ABT16373WQML的Datasheet PDF文件第5页浏览型号54ABT16373WQML的Datasheet PDF文件第6页 
Absolute Maximum Ratings (Note 1)  
(Across Comm Operating Range) Other Pins  
Over Voltage Latchup (I/O)  
−500 mA  
10V  
Storage Temperature  
Ambient Temperature under Bias  
Junction Temperature under Bias  
Ceramic  
−65˚C to +150˚C  
−55˚C to +125˚C  
−55˚C to +175˚C  
Recommended Operating  
Conditions  
VCC Pin Potential to  
Free Air Ambient Temperature  
Ground Pin  
−0.5V to +7.0V  
−0.5V to +7.0V  
Military  
−55˚C to +125˚C  
Input Voltage (Note 2)  
Input Current (Note 2)  
Voltage Applied to Any Output  
in the Disabled or  
Supply Voltage  
Military  
−30 mA to +5.0 mA  
+4.5V to +5.5V  
(V/t)  
Minimum Input Edge Rate  
Data Input  
50 mV/ns  
Power-Off State  
−0.5V to +5.5V  
−0.5V to VCC  
Enable Input  
20 mV/ns  
in the HIGH State  
Note 1: Absolute maximum ratings are values beyond which the device may  
be damaged or have its useful life impaired. Functional operation under these  
conditions is not implied.  
Current Applied to Output  
in LOW State (Max)  
twice the rated IOL (mA)  
−350 mA  
Note 2: Either voltage limit or current limit is sufficient to protect inputs.  
DC Latchup Source Current: OE Pin  
DC Electrical Characteristics  
Symbol  
Parameter  
ABT16373  
Units  
VCC  
Conditions  
Min Typ Max  
VIH  
Input HIGH Voltage  
2.0  
V
V
V
Recognized HIGH Signal  
Recognized LOW Signal  
VIL  
Input LOW Voltage  
0.8  
=
IIN −18 mA  
VCD  
VOH  
Input Clamp Diode Voltage  
Output HIGH Voltage  
−1.2  
Min  
=
IOH −3 mA  
54ABT 2.5  
=
IOH −24 mA  
54ABT 2.0  
54ABT  
=
IOL 48 mA  
VOL  
IIH  
Output LOW Voltage  
Input HIGH Current  
0.55  
5
V
Min  
=
VIN 2.7V (Note 4)  
µA  
Max  
=
VIN VCC  
5
=
VIN 7.0V  
IBVI  
IIL  
Input HIGH Current Breakdown Test  
Input LOW Current  
7
µA  
µA  
Max  
Max  
=
VIN 0.5V (Note 4)  
−5  
−5  
=
VIN 0.0V  
=
VID  
Input Leakage Test  
4.75  
V
0.0  
IID 1.9 µA  
All Other Pins Grounded  
= =  
0 − 5.5V VOUT 2.7V; OE 2.0V  
IOZH  
IOZL  
IOS  
Output Leakage Current  
Output Leakage Current  
Output Short-Circuit Current  
Output High Leakage Current  
Bus Drainage Test  
50  
−50  
−275  
50  
µA  
µA  
=
=
0 − 5.5V VOUT 0.5V; OE 2.0V  
=
VOUT 0.0V  
−100  
mA  
µA  
Max  
Max  
0.0  
=
VOUT VCC  
ICEX  
IZZ  
=
100  
2.0  
µA  
VOUT 5.5V; All Others GND  
ICCH  
ICCL  
ICCZ  
Power Supply Current  
Power Supply Current  
Power Supply Current  
mA  
mA  
mA  
Max  
Max  
Max  
All Outputs HIGH  
All Outputs LOW  
85  
=
2.0  
OE VCC  
All Others at VCC or GND  
=
VI VCC − 2.1V  
ICCT  
Additional ICC/Input  
Outputs Enabled  
Outputs TRI-STATE  
2.5  
2.5  
2.5  
mA  
mA  
mA  
=
Enable Input VI VCC − 2.1V  
Max  
Max  
=
Outputs TRI-STATE  
Data Input VI VCC − 2.1V  
All Others at VCC or GND  
=
Outputs Open, LE VCC  
ICCD  
Dynamic ICC  
(Note 4)  
No Load  
mA/  
=
0.15 MHz  
OE GND, (Note 3)  
One Bit Toggling, 50% Duty  
Cycle  
<
Note 3: For 8 bits toggling, I  
0.8 mA/MHz.  
CCD  
Note 4: Guaranteed, but not tested.  
3
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