Si512/513
Table 6. Output Clock Jitter and Phase Noise (HCSL)
VDD = 1.8 V ±5%, 2.5 or 3.3 V ±10%, TA = –40 to +85 oC; Output Format = HCSL
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
*
Period Jitter
(RMS)
JPRMS
10k samples
—
—
1.2
ps
*
Period Jitter
(Pk-Pk)
JPPKPK
φJ
10k samples
—
—
—
—
0.25
0.8
11
0.30
1.0
ps
ps
ps
Phase Jitter
(RMS)
1.875 MHz to 20 MHz integration
*
bandwidth (brickwall)
12 kHz to 20 MHz integration band-
*
width (brickwall)
Phase Noise,
156.25 MHz
φN
100 Hz
1 kHz
—
—
—
—
—
—
–90
–112
–120
–127
–140
–75
—
—
—
—
—
—
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc
10 kHz
100 kHz
1 MHz
Spurious
SPR
LVPECL output, 156.25 MHz,
offset>10 kHz
*Note: Applies to an output frequency of 100 MHz.
Table 7. Output Clock Jitter and Phase Noise (CMOS, Dual CMOS)
VDD = 1.8 V ±5%, 2.5 or 3.3 V ±10%, TA = –40 to +85 oC; Output Format = CMOS, Dual CMOS
Parameter
Phase Jitter
Symbol
Test Condition
Min
Typ
Max
Unit
φJ
1.875 MHz to 20 MHz integration
—
0.25
0.35
ps
2
(RMS)
bandwidth (brickwall)
12 kHz to 20 MHz integration band-
—
0.8
1.0
ps
2
width (brickwall)
Phase Noise,
156.25 MHz
φN
100 Hz
1 kHz
—
—
—
—
—
—
–86
–108
–115
–123
–136
–75
—
—
—
—
—
—
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc
10 kHz
100 kHz
1 MHz
Spurious
SPR
LVPECL output, 156.25 MHz,
offset>10 kHz
Notes:
1. Applies to output frequencies: 74.17582, 74.25, 75, 77.76, 100, 106.25, 125, 148.35165, 148.5, 150, 155.52, 156.25,
212.5 MHz.
2. Applies to output frequencies: 100, 106.25, 125, 148.35165, 148.5, 150, 155.52, 156.25, 212.5 MHz.
8
Rev. 1.2