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37000-A1

更新时间: 2022-09-18 17:15:43
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泰科 - TE 放大器
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Electrical Characterization of Packages for Use with GaAs MMIC Amplifiers

37000-A1 数据手册

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Application Note  
M542  
Electrical Characterization of Packages for Use with GaAs  
MMIC Amplifiers  
Rev. V4  
Abstract  
Package Description  
Manufacturer  
A test methodology will be presented which combines  
the advantage of on-wafer RF probing with a TRL  
calibration to create a completely de-embeddable,  
novel “test fixture” capable of electrically characteriz-  
ing most any style package or device. This scheme  
has been used to characterize many of the currently  
available microwave packages in order to identify ap-  
propriate packages for our MMIC amplifier products  
which cover frequencies up to 12 GHz. In addition,  
the technique has been employed to characterize in-  
jection-molded plastic packages and to evaluate non-  
probeable MMIC's.  
5 lead, ceramic  
6 lead, ceramic  
Kyocera  
Kyocera  
Leadless, 6 port, ceramic  
7 lead, ceramic  
StratEdge  
Kyocera  
8 lead, ceramic  
Kyocera  
8 lead, glass  
Mini-Systems  
Mini-Systems  
Oxley  
8 lead, glass, ground straps  
Leadless, 8 port, ceramic  
Leadless, 10 port, ceramic  
Introduction  
Alcoa  
Most package vendors have very little microwave  
design and characterization capability. Their lim-  
ited characterization efforts typically involve the use  
of poor fixturing, which obscures the true frequency  
response of the package. Companies specializing  
in fixturing, while investing considerable mechani-  
cal engineering effort, expend far less on electrical  
considerations, often producing fixtures inadequate  
for use at microwave frequencies. Consequently,  
there is very little microwave performance data  
available from package vendors.  
Table 1. Summary of Packages  
Design Approach  
To eliminate the need for expensive, device spe-  
cific, traditional fixtures and overcome their fre-  
quency limitations, an RF probeable ceramic sub-  
strate was designed as the interface to the device-  
under-test (DUT). Figure 1 illustrates this coplanar  
probe to microstrip transition. It is a 50 ohm line  
fabricated on 10-mil thick alumina, with an 8-mil  
pitch, ground-signal-ground (G-S-G) probe pattern  
at one end. The two ground pads are connected to  
the substrate backside with 8-mil diameter plated  
vias. The G-S-G pattern can be probed using com-  
mercially available microwave probes on a stan-  
dard microwave probe station. The opposite end of  
the substrate can be bonded to a test port of the  
DUT.  
Therefore, to evaluate and identify candidate pack-  
ages for each of the amplifiers in our MMIC ampli-  
fier product line, specific fixturing had to be devel-  
oped for each package style considered. A novel  
fixturing approach was designed and implemented,  
which not only eliminates the need for expensive,  
package specific fixtures, but also overcomes the  
frequency limitations of traditional connectorized,  
plunger-style fixtures. Additionally, a rigorous cali-  
bration method was developed which allows com-  
plete fixture de-embedding.  
To complete the “test fixture,” only a thin brass  
block is required to serve as the mounting surface  
for the ceramic substrates and the DUT. If neces-  
sary, the brass block could be machined to com-  
pensate for any difference in height between the  
substrate and DUT test port. To fixture practically  
any DUT, all that is needed is a brass plate and the  
probeable ceramic substrates. Figure 2 shows the  
configuration used for characterizing our  
MAAM71200-H1, a packaged 7-12 GHz GaAs  
MMIC low noise amplifier.  
This test methodology is applicable to practically  
any style device. Table 1 lists the package styles  
investigated. Through this work, proper electrical  
characterization of commonly used packages has  
indicated useful frequency ranges broader than  
expected by even the package manufacturers.  
This finding has allowed us to use low-cost pack-  
ages for frequency applications where our competi-  
tors typically resort to high-priced custom pack-  
ages.  
1
North America Tel: 800.366.2266 Europe Tel: +353.21.244.6400  
Visit www.macomtech.com for additional data sheets and product information.  
India Tel: +91.80.4155721  
China Tel: +86.21.2407.1588  
M/A-COM Technology Solutions Inc. and its affiliates reserve the right to make  
changes to the product(s) or information contained herein without notice.  

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