5秒后页面跳转
36521E10NKTDG PDF预览

36521E10NKTDG

更新时间: 2022-04-23 23:00:11
品牌 Logo 应用领域
泰科 - TE /
页数 文件大小 规格书
9页 137K
描述
Low Inductance, High Frequency Chip Inductor

36521E10NKTDG 数据手册

 浏览型号36521E10NKTDG的Datasheet PDF文件第3页浏览型号36521E10NKTDG的Datasheet PDF文件第4页浏览型号36521E10NKTDG的Datasheet PDF文件第5页浏览型号36521E10NKTDG的Datasheet PDF文件第6页浏览型号36521E10NKTDG的Datasheet PDF文件第8页浏览型号36521E10NKTDG的Datasheet PDF文件第9页 
Low Inductance, High Frequency Chip Inductor  
Type 3650 Series  
Environmental Characteristics -  
Mechanical Performance  
Item  
Specification  
Test Method  
Vibration Test:  
Test device shall be soldered on the substrate  
Oscillation Frequency: 10 to 55 to 10Hz for 1min  
Amplitude: 1.5mm  
Appearance: No damage  
L 5%  
Time: 2hrs for each axis (X, Y &Z), total 6hrs  
Q 10%  
Resistance to  
Solder Temperature: 260 5ꢀ°  
Immersion Time: 10 2sec  
Soldering Heat:  
Component Adhesion:  
1 lbs. For 0402  
2 lbs. For 0603  
3 lbs. For the rest  
The device should be REFLOW soldered  
(230 5ꢀ° for 10 seconds) to a tinned copper  
substrate. A dynamiter force gauge should be  
applied to the side of the component. The device  
must with stand a minimum force of 2 or 4  
pounds without a failure of the termination  
attached to component.  
(Push Test)  
Drop Test:  
After test, there shall be no  
evidence of electrical or  
mechanical damage  
Drop once for each face and once for each  
corner. Total drop 10 Times.  
Drop height :100cm  
Drop weight:125g  
Solderability Test:  
The terminal should at least be  
90% covered with solder.  
After fluxing (alpha 100 or equiv), inductor shall  
be dipped in a melted solder bath at 260 5ꢀ°  
for 5 seconds.  
Resistance to Solvent Test:  
There shall be no case of  
deformation change in  
appearance or obliteration of  
marking  
MIL-STD202F,METHOD 215D  
Electrical Performance  
Item  
Specification  
Test Method  
Inductance:  
Q:  
HP4291B  
HP4291B  
REFER to Standard Electrical  
°haracteristic List  
SRF:  
HP8753D  
DC Resistance R  
:
Micro-Ohmeter (Gom-801G)  
Applied the current to coils, L <10%  
Applied 2 times rated current for 5 minutes  
dc  
Rated Current IDC:  
Overload Test:  
After test, there shall be  
no evidence of electrical and  
mechanical damage  
Withstanding Voltage Test:  
Insulation Resistance Test:  
After test, there shall be no  
evidence of electrical and  
mechanical damage.  
Ac voltage of 500 VA° applied between inductors  
terminal and case for 1 minute.  
1000M OHM MIN.  
100 VD° applied between inductor terminal  
and case  
Literature No. 1773163  
Issued: 12-05  
Dimensions are shown for  
reference purposes only.  
Dimensions are in millimetres Specifications subject to  
unless otherwise specified. change.  
www.tycoelectronics.com  
passives.tycoelectronics.com  

与36521E10NKTDG相关器件

型号 品牌 描述 获取价格 数据表
36521E10NKTE TE Low Inductance, High Frequency Chip Inductor

获取价格

36521E10NMTDG TE Low Inductance, High Frequency Chip Inductor

获取价格

36521E10NMTE TE Low Inductance, High Frequency Chip Inductor

获取价格

36521E1N6GTDG TE Low Inductance, High Frequency Chip Inductor

获取价格

36521E1N6GTE TE Low Inductance, High Frequency Chip Inductor

获取价格

36521E1N6JTDG TE Low Inductance, High Frequency Chip Inductor

获取价格