VS-31DQ09, VS-31DQ09-M3, VS-31DQ10, VS-31DQ10-M3
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Vishay Semiconductors
ELECTRICAL SPECIFICATIONS
PARAMETER
SYMBOL
TEST CONDITIONS
VALUES
0.85
0.97
0.69
0.80
1
UNITS
3 A
TJ = 25 °C
6 A
Maximum forward voltage drop
See fig. 1
(1)
VFM
V
3 A
TJ = 125 °C
6 A
TJ = 25 °C
TJ = 125 °C
Maximum reverse leakage current
See fig. 4
(1)
IRM
V
R = Rated VR
mA
3
Typical junction capacitance
Typical series inductance
CT
LS
VR = 5 VDC (test signal range 100 kHz to 1 MHz) 25 °C
Measured lead to lead 5 mm from package body
Rated VR
110
pF
nH
9.0
Maximum voltage rate of charge
dV/dt
10 000
V/µs
Note
(1)
Pulse width < 300 μs, duty cycle < 2 %
THERMAL - MECHANICAL SPECIFICATIONS
PARAMETER
SYMBOL
TEST CONDITIONS
VALUES
UNITS
Maximum junction and storage
temperature range
TJ (1), TStg
- 40 to 150
°C
Maximum thermal resistance,
junction to ambient
DC operation
Without cooling fin
RthJA
RthJL
80
15
°C/W
Typical thermal resistance,
junction to lead
DC operation
1.2
g
Approximate weight
Marking device
0.042
oz.
31DQ09
31DQ10
Case style C-16
Note
dPtot
1
(1)
------------- < -------------- thermal runaway condition for a diode on its own heatsink
dTJ RthJA
Revision: 19-Sep-11
Document Number: 93321
2
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