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2SK2037TE85L PDF预览

2SK2037TE85L

更新时间: 2024-02-18 22:14:03
品牌 Logo 应用领域
东芝 - TOSHIBA 开关光电二极管晶体管
页数 文件大小 规格书
5页 286K
描述
TRANSISTOR 100 mA, 20 V, N-CHANNEL, Si, SMALL SIGNAL, MOSFET, FET General Purpose Small Signal

2SK2037TE85L 技术参数

生命周期:Obsolete包装说明:SMALL OUTLINE, R-PDSO-G3
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8541.21.00.95风险等级:5.76
配置:SINGLE WITH BUILT-IN DIODE AND RESISTOR最小漏源击穿电压:20 V
最大漏极电流 (ID):0.1 A最大漏源导通电阻:6 Ω
FET 技术:METAL-OXIDE SEMICONDUCTORJESD-30 代码:R-PDSO-G3
元件数量:1端子数量:3
工作模式:ENHANCEMENT MODE最高工作温度:150 °C
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:SMALL OUTLINE极性/信道类型:N-CHANNEL
认证状态:Not Qualified表面贴装:YES
端子形式:GULL WING端子位置:DUAL
晶体管应用:SWITCHING晶体管元件材料:SILICON
Base Number Matches:1

2SK2037TE85L 数据手册

 浏览型号2SK2037TE85L的Datasheet PDF文件第2页浏览型号2SK2037TE85L的Datasheet PDF文件第3页浏览型号2SK2037TE85L的Datasheet PDF文件第4页浏览型号2SK2037TE85L的Datasheet PDF文件第5页 
2SK2037  
TOSHIBA Field Effect Transistor Silicon N Channel Type  
2SK2037  
High Speed Switching Applications  
Unit: mm  
Analog Switching Applications  
High input impedance.  
Low gate threshold voltage: V = 0.5~1.5 V  
th  
Excellent switching times: t = 0.28 μs (typ.)  
on  
t
off  
= 0.34 μs (typ.)  
Small package.  
Enhancement-mode  
Marking  
Equivalent Circuit  
JEDEC  
JEITA  
Absolute Maximum Ratings (Ta = 25°C)  
SC-70  
2-2E1E  
TOSHIBA  
Characteristics  
Drain-source voltage  
Symbol  
Rating  
Unit  
Weight: 0.006 g (typ.)  
V
20  
10  
V
V
DS  
Gate-source voltage  
DC drain current  
V
GSS  
I
100  
mA  
mW  
°C  
D
Drain power dissipation  
Channel temperature  
Storage temperature range  
P
100  
D
ch  
stg  
T
150  
T
55~150  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note: This transistor is electrostatic sensitive device. Please handle with caution.  
1
2007-11-01  

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