1SS396
TOSHIBA Diode Silicon Epitaxial Schottky Barrier Type
1SS396
Low Voltage High Speed Switching
Unit: mm
z Low forward voltage
z Low reverse current
z Small package
: V
= 0.54V (typ.)
F (3)
: I = 5μA (max.)
R
: SC-59
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
Maximum (peak) reverse Voltage
Reverse voltage
V
45
40
V
V
RM
V
R
Maximum (peak) forward current
Average forward current
Surge current (10ms)
I
300 *
100 *
1 *
mA
mA
A
FM
I
O
I
FSM
P
Power dissipation
150 *
125
mW
°C
°C
°C
Junction temperature
T
j
Storage temperature range
Operating temperature range
T
−55∼125
−40∼100
stg
opr
JEDEC
TO-236MOD
T
JEITA
SC-59
TOSHIBA
1-3G1G
Note: Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in
Weight: 0.012g (typ.)
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating
conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
* Unit rating. Total rating = unit rating × 0.7
Electrical Characteristics (Ta = 25°C)
Test
Circuit
Characteristic
Symbol
Test Condition
= 1mA
Min
Typ.
Max
Unit
V
V
V
V
―
I
I
I
―
―
―
―
0.28
0.36
0.54
―
―
―
F (1)
F (2)
F (3)
F
F
F
Forward voltage
―
= 10mA
= 100mA
= 40V
―
0.60
5
Reverse current
I
―
V
V
μA
R
R
Total capacitance
C
T
―
= 0, f = 1MH
z
―
18
25
R
pF
Marking
1
2007-11-01