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1N5365B PDF预览

1N5365B

更新时间: 2024-02-23 05:31:35
品牌 Logo 应用领域
安森美 - ONSEMI 二极管测试
页数 文件大小 规格书
8页 74K
描述
5 Watt Surmetic 40 Zener Voltage Refulators

1N5365B 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Active包装说明:O-PALF-W2
针数:2Reach Compliance Code:compliant
ECCN代码:EAR99HTS代码:8541.10.00.50
风险等级:5.48外壳连接:ISOLATED
配置:SINGLE二极管元件材料:SILICON
二极管类型:ZENER DIODEJESD-30 代码:O-PALF-W2
JESD-609代码:e0湿度敏感等级:1
元件数量:1端子数量:2
最高工作温度:150 °C最低工作温度:-65 °C
封装主体材料:PLASTIC/EPOXY封装形状:ROUND
封装形式:LONG FORM峰值回流温度(摄氏度):NOT SPECIFIED
极性:UNIDIRECTIONAL最大功率耗散:5 W
标称参考电压:36 V表面贴装:NO
技术:ZENER端子面层:TIN LEAD
端子形式:WIRE端子位置:AXIAL
处于峰值回流温度下的最长时间:NOT SPECIFIED最大电压容差:20%
工作测试电流:30 mABase Number Matches:1

1N5365B 数据手册

 浏览型号1N5365B的Datasheet PDF文件第2页浏览型号1N5365B的Datasheet PDF文件第3页浏览型号1N5365B的Datasheet PDF文件第4页浏览型号1N5365B的Datasheet PDF文件第5页浏览型号1N5365B的Datasheet PDF文件第6页浏览型号1N5365B的Datasheet PDF文件第8页 
1N5333B Series  
100  
10  
1
0.1  
80  
100  
120  
140  
160  
180  
200  
220  
V , ZENER VOLTAGE (VOLTS)  
Z
Figure 9. Zener Voltage versus Zener Current  
VZ = 82 thru 200 Volts  
APPLICATION NOTE  
Since the actual voltage available from a given Zener  
diode is temperature dependent, it is necessary to determine  
junction temperature under any set of operating conditions  
in order to calculate its value. The following procedure is  
recommended:  
For worst-case design, using expected limits of I , limits  
Z
of P and the extremes of T (DT ) may be estimated.  
D
J
J
Changes in voltage, V , can then be found from:  
Z
DV = qVZ DTJ  
q
, the Zener voltage temperature coefficient, is found  
VZ  
Lead Temperature, T , should be determined from:  
L
from Figures 2 and 3.  
TL = qLA PD + TA  
Under high power-pulse operation, the Zener voltage will  
vary with time and may also be affected significantly by the  
zener resistance. For best regulation, keep current  
excursions as low as possible.  
q
is the lead-to-ambient thermal resistance and P is the  
D
LA  
power dissipation.  
Junction Temperature, T , may be found from:  
J
TJ = TL + DTJL  
Data of Figure 4 should not be used to compute surge  
capability. Surge limitations are given in Figure 5. They are  
lower than would be expected by considering only junction  
temperature, as current crowding effects cause temperatures  
to be extremely high in small spots resulting in device  
degradation should the limits of Figure 5 be exceeded.  
DT is the increase in junction temperature above the lead  
temperature and may be found from Figure 4 for a train of  
power pulses or from Figure 1 for dc power.  
JL  
DTJL = qJL PD  
http://onsemi.com  
7

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