HIGH VOLTAGE MLCC
◆可靠性测试 Reliability Test
项目
技术规格
测 试 方 法
Item
Technical Specification
Test Method and Remarks
±7.5%或±0.75pF,取两者之中较大者
±7.5% or ±0.75pF, whichever is larger.
C0G
ΔC
/C
X7R
Y5V
-12.5% ~ +12..5%
-30% ~ +30%
温度:40±2℃
湿度:90~95%RH
电压:额定电压
时间:500 小时
≤2 倍初始标准
Not more than twice of initial value.
DF
IR
C0G
X7R
Y5V
Ri≥5000MΩ或 Ri•CR≥50S 取两者之中较小者.
Ri≥5000MΩ 或
smaller.
Ri≥1000MΩ或 Ri•CR≥10S 取两者之中较小者.
Ri≥1000MΩ 或
smaller.
放置条件:室温
放置时间:24 小时(Ⅰ类);48 小时(Ⅱ类)
Temperature: 40±2℃
Humidity: 90~95%RH
Voltage: Rated Voltage
Duration: 500h
Recovery conditions: Room temperature
Recovery Time: 24h (Class1) or 48h (Class2)
Ri•CR≥50S whichever is
耐湿负荷
Humidity load
Ri•CR≥10S whichever is
Ri≥400MΩ或 Ri•CR≥10S 取两者之中较小者.
Ri≥400MΩ或 Ri•CR≥10S whichever is smaller.
外观:无损伤
Appearance: No visible damage.
±2%或±1pF,取两者之中较大者
±2% or ±1pF, whichever is larger.
C0G
电压:
100V≤额定电压≤200V:1.5 倍工作电压
200V<额定电压≤500V:1.3 倍工作电压
ΔC
/C
X7R
Y5V
-20% ~ +20%
500V<额定电压:
时间:1000 小时
1.2 倍工作电压
-30% ~ +30%
≤2 倍初始标准
Not more than twice of initial value.
温度:125℃(NPO、X7R) 85℃(Y5V)
充电电流:不应超过 50mA
放置条件:室温
DF
IR
C0G
Ri≥4000MΩ或 Ri•CR≥40S 取两者之中较小者
Ri≥4000MΩ 或
Ri•CR≥40S whichever is
寿命试验
Life Test
放置时间:24 小时(Ⅰ类),或 48小时(Ⅱ类)
Applied Voltage:
100V≤Rated Voltage≤200V: 1.5 Multiple
200V<Rated Voltage≤500V: 1.3 Multiple
smaller.
Ri≥2000MΩ或 Ri•CR≥50S 取两者之中较小者.
X7R
Ri≥2000MΩ 或
Ri•CR≥50S whichever is
500V<Rated Voltage:
1.2 Multiple
smaller.
Duration: 1000h
外观:无损伤
Appearance: No visible damage.
Temperature:125℃(NPO、X7R) 85℃(Y5V)
Charge/Discharge Current:50mA max.
Recovery Conditions: Room Temperature
Recovery Time: 24h (Class 1), or 48h (Class2)
注解:专门预处理※(仅对 2 类电容器):将电容器放在上限类别温度或按详细规范中可能规定的更高温度下经 1h 后,接着在试验的标准大
气条件下恢复 24±1h。
Note : Pretreatment (only for class2 capacitor) : Pretreatment (only for class2 capacitor) is a method to treat the capacitor before
measurement. First, place the capacitor in the up-category temperature or other specified higher temperature environment for
1hour. Then recovery the capacitor at standard pressure conditions for 24±1hours。