Datasheet > 1024-60LH/883

1024-60LH/883

更新时间： 2022-11-25 13:07:51

品牌	Logo	应用领域
莱迪思 - LATTICE		/
页数	文件大小	规格书
12页	148K
描述
In-System Programmable High Density PLD

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1024-60LH/883 数据手册

Specifications ispLSI 1024/883

Switching Test Conditions

Figure 2. Test Load

Input Pulse Levels

GND to 3.0V

≤ 3ns 10% to 90%

1.5V

Input Rise and Fall Time

Input Timing Reference Levels

Output Timing Reference Levels

Output Load

+ 5V

1.5V

See figure 2

Device

Output

Test

Point

3-state levels are measured 0.5V from steady-state

active level.

Table 2- 0003

C *

Output Load Conditions (see figure 2)

C includes Test Fixture and Probe Capacitance.

Test Condition

470Ω

390Ω

35pF

5pF

Active High

Active Low

∞

470Ω

Active High to Z

at V_OH- 0.5V

∞

Active Low to Z

470Ω

390Ω

5pF

at V_OL+ 0.5V

Table 2- 0004A

DC Electrical Characteristics

Over Recommended Operating Conditions

CONDITION

I_OL=8 mA

PARAMETER

Output Low Voltage

MIN. TYP.

MAX.

0.4

UNITS

SYMBOL

–

2.4

–

I_OH=-4 mA

Output High Voltage

–

0V ≤ V_IN≤ V_IL(MAX.)

3.5V ≤ V_IN≤ V_CC

Input or I/O Low Leakage Current

Input or I/O High Leakage Current

isp Input Low Leakage Current

I/O Active Pull-Up Current

-10

µA

–

µA

0V ≤ V_IN≤ V_IL(MAX.)

0V ≤ V_IN≤ V_IL

–

-150

IL-isp

IL-PU

–

V_CC= 5V, V_OUT= 0.5V

V_IL= 0.5V, V_IH= 3.0V

f_TOGGLE= 1 MHz

Output Short Circuit Current

Operating Power Supply Current

–

-200

215

2,4

–

135

1. One output at a time for a maximum duration of one second. V_out= 0.5V was selected to avoid test problems by tester ground

degradation. Characterized but not 100% tested.

2. Measured using six 16-bit counters.

3. Typical values are at V_CC= 5V and T_A= 25^oC.

4. Maximum I_CCvaries widely with specific device configuration and operating frequency. Refer to the Power Consumption sec-

tion of this datasheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to estimate maximum

I_CC.

0007A-24 mil

1 2 345 6 7...12

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