Thin-Film RF/Microwave Capacitor Technology
Automotive Grade Accu-P® Series
Environmental / Mechanical Characteristics
ENVIRONMENTAL CHARACTERISTICS
TEST
CONDITIONS
REQUIREMENT
No visible damage
Δ C/C ≤ 2% for C≥5pF
Δ C ≤ 0.25pF for C<5pF
Life (Endurance)
MIL-STD-202F Method 108A
125°C, 2UR,1000 hours
Accelerated Damp
Heat Steady State
MIL-STD-202F Method 103B
No visible damage
Δ C/C ≤ 2% for C≥5pF
Δ C ≤ 0.25pF for C<5pF
85°C, 85% RH, UR, 1000 hours
Temperature Cycling
MIL-STD-202F Method 107E
MIL-STD-883D Method 1010.7
No visible damage
Δ C/C ≤ 2% for C≥5pF
Δ C ≤ 0.25pF for C<5pF
-55°C to +125°C, 15 cycles – Accu-P®
260°C ± 5°C for 10 secs
Resistance to Solder Heat
C remains within initial limits
IEC-68-2-58
MECHANICAL CHARACTERISTICS
TEST
CONDITIONS
REQUIREMENT
Solderability
IEC-68-2-58
Components completely immersed in a solder bath at 235°C for
Terminations to be well tinned, minimum 95% coverage
2 secs.
Leach Resistance
IEC-68-2-58
Components completely immersed in a solder bath at 260±5°C for
Dissolution of termination faces ≤15% of area
Dissolution of termination edges ≤25% of length
60 secs.
Adhesion
MIL-STD-202F Method 211A
A force of 5N applied for 10 secs.
Tested as shown in diagram
No visible damage
No visible damage
Δ C/C ≤ 2% for C≥5pF
Δ C ≤ 0.25pF for C<5pF
Termination Bond Strength
IEC-68-2-21 Amend. 2
D = 3mm Accu-P
D = 1mm Accu-F
Robustness of Termination
A force of 5N applied for 10 secs.
55Hz to 2000Hz, 20G
No visible damage
No visible damage
IEC-68-2-21 Amend. 2
High Frequency Vibration
MIL-STD-202F Method 201A,
204D (Accu-P® only)
12 months minimum with components stored in “as
received” packaging
Storage
Good solderability
QUALITY & RELIABILITY
QUALITY ASSURANCE
Accu-P® is based on well established thin-film technology and materials.
The reliability of these thin-film chip capacitors has been studied
intensively for several years. Various measures have been taken
to obtain the high reliability required today by the industry. Quality
assurance policy is based on well established international industry
standards. The reliability of the capacitors is determined by accelerated
testing under the following conditions:
• ON-LINE PROCESS CONTROL
This program forms an integral part of the production cycle and acts
as a feedback system to regulate and control production processes.
The test procedures, which are integrated into the production process,
were developed after long research work and are based on the highly
developed semiconductor industry test procedures and equipment.
These measures help KYOCERA AVX to produce a con- sistent and high
yield line of products.
Life (Endurance)
Accelerated Damp
Heat Steady State
125°C, 2UR, 1000 hours
85°C, 85% RH, UR, 1000 hours.
• FINAL QUALITY INSPECTION
Finished parts are tested for standard electrical parameters and visual/
mechanical characteristics. Each production lot is 100% evaluated
for: capacitance and proof voltage at 2.5 UR. In addition, production is
periodically evaluated for:
Average capacitance with histogram printout for capacitance
distribution;
IR and Breakdown Voltage distribution;
Temperature Coefficient;
Solderability;
Dimensional, mechanical and temperature stability.
The Important Information/Disclaimer is incorporated in the catalog where these specifications came from or available
online at www.kyocera-avx.com/disclaimer/ by reference and should be reviewed in full before placing any order.
39
TDS-RFM-0041 | Rev 1
rf microwave products
–
–
5秒后页面跳转
热敏电阻型号命名规则的深度解析
晶闸管控制角与电压关系专业性解答
平面型VDMOS与超结型VDMOS的雪崩耐量差异及选择指南
快速解读数据手册：HT7533引脚图说明、参数分析、技术特点
微信公众号
抖音公众号
浙公网安备 33010502006866号 浙ICP备10014259号-119
营业执照ICP证
数据手册
如果您发现信息不准确，
