Multilayer Ceramic Capacitors
Approval Sheet
No.
Item
Test Condition
Requirements
* Conduct the five cycles according to the temperatures and
time.
12. Temperature
Cycle
* No remarkable damage.
* Cap change：
Step
Temp. (°C)
Min. operating temp. +0/-3
Room temp.
Time (min.)
30±3
NP0: within ±2.5％ or ±0.25pF whichever is larger.
X7R: within ±7.5%
1
2
3
4
2~3
* Q/D.F., I.R. and dielectric strength: To meet initial requirements.
Max. operating temp. +3/-0
Room temp.
30±3
2~3
*Before initial measurement (Class II only): To apply de-aging
at 150°C for 1hr then set for 24±2 hrs at room temp .
* Cap. / DF(Q) / I.R. Measurement to be made after de-aging
at 150°C for 1hr then set for 24±2 hrs at room temp .
* Test temp.: 40±2°C
13. Humidity
(Damp Heat)
Steady State
* No remarkable damage.
* Humidity: 90~95% RH
* Cap change: NP0: within ±5.0% or ±0.5pF whichever is larger.
X7R: within ±12.5%
* Test time: 500+24/-0hrs.
*Before initial measurement (Class II only): To apply de-aging * Q/D.F. value:
at 150°C for 1hr then set for 24±2 hrs at room temp .
* Cap. / DF(Q) / I.R. Measurement to be made after de-aging
at 150°C for 1hr then set for 24±2 hrs at room temp .
NP0: Cap≥30pF, Q≥350; 10pF≤Cap<30pF, Q≥275+2.5C
Cap<10pF; Q≥200+10C
X7R: ≤3.0%
* I.R.: ≥1GΩ or RxC≥50Ω-F whichever is smaller.
14. Humidity
(Damp Heat)
Load
* Test temp.: 40±2°C
* No remarkable damage.
* Humidity: 90~95%RH
* Cap change: NP0: within ±7.5% or ±0.75pF whichever is larger.
X7R: within ±12.5%
* Test time: 500+24/-0 hrs.
* To apply voltage：rated voltage (Max. 500V)
*Before initial measurement (Class II only): To apply de-aging
at 150°C for 1hr then set for 24±2 hrs at room temp .
* Cap. / DF(Q) / I.R. Measurement to be made after de-aging
at 150°C for 1hr then set for 24±2 hrs at room temp .
* Test temp.:
* Q/D.F. value:
NP0: Cap≥30pF, Q≥200; Cap<30pF, Q≥100+10/3C
X7R: ≤3.0%
* I.R.: ≥500MΩ or RxC≥25Ω-F whichever is smaller.
15. High
Temperature
Load
* No remarkable damage.
NP0, X7R: 125±3°C
* Cap change: NP0: within ±3.0% or ±0.3pF whichever is larger.
X7R: within ±12.5%
* To apply voltage:
(Endurance)
(1) 1206/NP0 (3kV) ≥1.5pF: 100% of rated voltage.
1812N472&1812N562(1KV): 100% of rated voltage.
(2) 200V~300V: 200% of rated voltage.
(3) 400V~450V: 120% of rated voltage.
(4) 500V: 150% of rated voltage.
* Q/D.F. value:
NP0: Cap≥30pF, Q≥350
10pF≤Cap<30pF, Q≥275+2.5C
Cap<10pF, Q≥200+10C
X7R: ≤3.0%
(5) 630V~3000V: 120% of rated voltage.
(6) 4000V: 110% of rated voltage.
* I.R.: ≥1GΩ or RxC≥50Ω-F whichever is smaller.
* Test time: 1000+24/-0 hrs.
*Before initial measurement (Class II only): To apply de-aging
at 150°C for 1hr then set for 24±2 hrs at room temp .
* Cap. / DF(Q) / I.R. Measurement to be made after de-aging at
150°C for 1hr then set for 24±2 hrs at room temp.
* "Room condition" Temperature: 15 to 35°C, Relativ e humidity: 25 to 75%, Atmospheric pressure: 86 to 106kPa.
Page 9 of 12
ASC_Middle & High Voltage
Jul. 2023
5秒后页面跳转
STM32H743技术深度剖析与应用案例探索
LM321中文资料解析：引脚功能介绍、技术特点、技术特性分析
74HC14芯片资料介绍：性能特性分析、引脚介绍
LM1875芯片手册：功放参数分析、引脚说明、电路设计要点
微信公众号
抖音公众号
浙公网安备 33010502006866号 浙ICP备10014259号-119
营业执照ICP证
数据手册
如果您发现信息不准确，
