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UPD44644095F5-E50-FQ1-A PDF预览

UPD44644095F5-E50-FQ1-A

更新时间: 2023-01-15 00:00:00
品牌 Logo 应用领域
瑞萨 - RENESAS 双倍数据速率静态存储器内存集成电路
页数 文件大小 规格书
40页 370K
描述
IC,SYNC SRAM,DDR,8MX9,CMOS,BGA,165PIN,PLASTIC

UPD44644095F5-E50-FQ1-A 数据手册

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PRELIMINARY DATA SHEET  
MOS INTEGRATED CIRCUIT  
μPD44644085, 44644095, 44644185, 44644365  
72M-BIT DDR II SRAM SEPARATE I/O  
2-WORD BURST OPERATION  
Description  
The μPD44644085 is a 8,388,608-word by 8-bit, the μPD44644095 is a 8,388,608-word by 9-bit, the μPD44644185 is a  
4,194,304-word by 18-bit and the μPD44644365 is a 2,097,152-word by 36-bit synchronous double data rate static RAM  
fabricated with advanced CMOS technology using full CMOS six-transistor memory cell.  
The μPD44644085, μPD44644095, μPD44644185 and μPD44644365 integrate unique synchronous peripheral circuitry  
and a burst counter. All input registers controlled by an input clock pair (K and K#) are latched on the positive edge of K  
and K#.  
These products are suitable for application which require synchronous operation, high speed, low voltage, high density  
and wide bit configuration.  
These products are packaged in 165-pin PLASTIC BGA.  
Features  
1.8 0.1 V power supply  
165-pin PLASTIC BGA package (15 x 17)  
HSTL interface  
PLL circuitry for wide output data valid window and future frequency scaling  
Separate independent read and write data ports  
DDR read or write operation initiated each cycle  
Pipelined double data rate operation  
Separate data input/output bus  
Two-tick burst for low DDR transaction size  
Two input clocks (K and K#) for precise DDR timing at clock rising edges only  
Two output clocks (C and C#) for precise flight time and clock skew matching-clock  
and data delivered together to receiving device  
Internally self-timed write control  
Clock-stop capability. Normal operation is restored in 1,024 cycles after clock is resumed.  
User programmable impedance output  
Fast clock cycle time : 3.7 ns (270 MHz), 4.0 ns (250 MHz), 5.0 ns (200 MHz)  
Simple control logic for easy depth expansion  
JTAG boundary scan  
The information in this document is subject to change without notice. Before using this document, please  
confirm that this is the latest version.  
Not all products and/or types are available in every country. Please check with an NEC Electronics  
sales representative for availability and additional information.  
Document No. M18230EJ2V0DS00 (2nd edition)  
Date Published February 2007 NS CP(N)  
Printed in Japan  
2006  
The mark <R> shows major revised points.  
The revised points can be easily searched by copying an "<R>" in the PDF file and specifying it in the "Find what:" field.  

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