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UC2827N-2G4 PDF预览

UC2827N-2G4

更新时间： 2024-09-26 15:55:51
品牌 Logo 应用领域
德州仪器 - TI 开关光电二极管
页数 文件大小 规格书
15页 393K
描述
1A SWITCHING CONTROLLER, 500kHz SWITCHING FREQ-MAX, PDIP24, PLASTIC, DIP-24

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UC2827N-2G4 技术参数

是否无铅： 不含铅是否Rohs认证： 符合
生命周期：Obsolete零件包装代码：DIP
包装说明：DIP, DIP24,.6针数：24
Reach Compliance Code：compliantECCN代码：EAR99
HTS代码：8542.39.00.01风险等级：5.83
其他特性：CAN ALSO WORK IN CURRENT MODE模拟集成电路 - 其他类型：SWITCHING CONTROLLER
控制模式：VOLTAGE-MODE控制技术：PULSE WIDTH MODULATION
最大输入电压：20 V最小输入电压：9.5 V
标称输入电压：15 VJESD-30 代码：R-PDIP-T24
长度：31.75 mm功能数量：1
端子数量：24最高工作温度：85 °C
最低工作温度：-40 °C最大输出电流：1 A
封装主体材料：PLASTIC/EPOXY封装代码：DIP
封装等效代码：DIP24,.6封装形状：RECTANGULAR
封装形式：IN-LINE峰值回流温度（摄氏度）：NOT SPECIFIED
认证状态：Not Qualified座面最大高度：5.08 mm
子类别：Switching Regulator or Controllers表面贴装：NO
切换器配置：PUSH-PULL最大切换频率：500 kHz
技术：BIPOLAR温度等级：INDUSTRIAL
端子形式：THROUGH-HOLE端子节距：2.54 mm
端子位置：DUAL处于峰值回流温度下的最长时间：NOT SPECIFIED
宽度：15.24 mmBase Number Matches：1

UC2827N-2G4 数据手册

 浏览型号UC2827N-2G4的Datasheet PDF文件第2页浏览型号UC2827N-2G4的Datasheet PDF文件第3页浏览型号UC2827N-2G4的Datasheet PDF文件第4页浏览型号UC2827N-2G4的Datasheet PDF文件第5页浏览型号UC2827N-2G4的Datasheet PDF文件第6页浏览型号UC2827N-2G4的Datasheet PDF文件第7页 
UC2827-1, UC2827-2  
UC3827-1, UC3827-2  
www.ti.com  
SLUS365B–APRIL 1999–REVISED FEBRUARY 2007  
BUCK CURRENT/VOLTAGE FED PUSH-PULL  
PWM CONTROLLERS  
FEATURES  
DESCRIPTION  
•
Ideal for Multiple Output and/or High  
Voltage Output Voltage Converters  
The UC3827 family of controller devices provides an  
integrated control solution for cascaded buck and  
push-pull converters. These converters are known as  
current fed or voltage fed push-pull converters and  
are ideally suited for multiple output and/or high  
voltage output applications. In both current fed and  
voltage fed modes, the push-pull switches are driven  
at 50% nominal duty cycles and at one half the  
switching frequency of the buck stage. In the current  
fed mode, the two switches are driven with a  
specified over-lap period to prevent ringing and  
voltage stress on the devices. In the voltage fed  
mode, the two switches are driven with a specified  
gap time between the switches to prevent shorting  
the transformer across the energy storage capacitor  
and to prohibit excessive currents flowing through  
the devices.  
•
•
Up to 500 kHz Operation  
High Voltage, High Current Floating  
Driver for Buck Converter Stage  
•
•
•
UC3827-1 Current Fed Controller has  
Push-Pull Drivers with Overlapping  
Conduction Periods  
UC3827-2 Voltage Fed Controller has  
Push-Pull Drivers with Nonoverlapping  
Conduction Periods  
Average Current Mode, Peak Current  
Mode or Voltage Mode with Input  
Voltage Feedforward Control for Buck  
Power Stage  
•
•
Wide Bandwidth, Low Offset,  
Differential Current Sense Amplifier  
The converter's output voltage is regulated by pulse  
width modulation of the buck switch. The UC3827  
contains complete protection and PWM control  
functions for the buck converter. Easy control of the  
floating switch is accomplished by the floating drive  
circuitry. The gate drive waveform is level shifted to  
Precise Short Circuit Current Control  
support an input voltage up to 72 VDC  
.
BLOCK DIAGRAM  
VEAOCEA+ CEAO RAMP  
10  
12  
6
5
Voltage Error  
Amplifier  
14  
16  
13  
7
VEA+  
VEA−  
CEA−  
CSAO  
CSA+  
CSA−  
SS  
0.7 V PWM Comparator  
Current Error  
Amplifier  
R
D
Flying  
Driver  
1
2
3
V+  
+3 V  
ILIM Comparator  
8
S
Q
BUCK  
SRC  
9
Current Sense  
Amplifier  
SS  
INHBT  
UV  
4
OSC  
19  
18  
17  
15  
23  
21 PGND  
SYNC  
CT  
OSC  
Q
DELAY  
T
500 kHz  
MAX  
Push/Pull  
Drivers  
RT  
Q
REF  
24 PUSH  
22 PULL  
VCC  
REF  
&
UVLO  
UVLO  
DELAY  
11  
GND  
20  
DELAY  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 1999–2007, Texas Instruments Incorporated  
1234567...15

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