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TSC2014IYZGR PDF预览

TSC2014IYZGR

更新时间: 2024-09-27 12:22:31
品牌 Logo 应用领域
德州仪器 - TI 微控制器和处理器外围集成电路
页数 文件大小 规格书
7页 435K
描述
1.2V to 3.6V, 12-Bit, Nanopower, 4-Wire TOUCH SCREEN CONTROLLER with I2C™ Interface

TSC2014IYZGR 技术参数

是否无铅:不含铅是否Rohs认证:符合
生命周期:Active零件包装代码:BGA
包装说明:WCSP-12针数:12
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8542.39.00.01Factory Lead Time:6 weeks
风险等级:1.72Is Samacsys:N
具有ADC:YES地址总线宽度:
DAC 通道:NODMA 通道:NO
外部数据总线宽度:JESD-30 代码:R-XBGA-B12
JESD-609代码:e1长度:2.055 mm
湿度敏感等级:1DMA 通道数量:
端子数量:12最高工作温度:85 °C
最低工作温度:-40 °CPWM 通道:NO
封装主体材料:UNSPECIFIED封装代码:VFBGA
封装形状:RECTANGULAR封装形式:GRID ARRAY, VERY THIN PROFILE, FINE PITCH
认证状态:Not Qualified座面最大高度:0.625 mm
速度:4.3 MHz最大供电电压:3.6 V
最小供电电压:1.2 V标称供电电压:1.6 V
表面贴装:YES技术:CMOS
温度等级:INDUSTRIAL端子面层:Tin/Silver/Copper (Sn/Ag/Cu)
端子形式:BALL端子节距:0.5 mm
端子位置:BOTTOM宽度:1.55 mm
uPs/uCs/外围集成电路类型:MICROCONTROLLERBase Number Matches:1

TSC2014IYZGR 数据手册

 浏览型号TSC2014IYZGR的Datasheet PDF文件第2页浏览型号TSC2014IYZGR的Datasheet PDF文件第3页浏览型号TSC2014IYZGR的Datasheet PDF文件第4页浏览型号TSC2014IYZGR的Datasheet PDF文件第5页浏览型号TSC2014IYZGR的Datasheet PDF文件第6页浏览型号TSC2014IYZGR的Datasheet PDF文件第7页 
TSC2014  
www.ti.com  
SBAS522 SEPTEMBER 2010  
1.2V to 3.6V, 12-Bit, Nanopower, 4-Wire  
TOUCH SCREEN CONTROLLER with I2CInterface  
Check for Samples: TSC2014  
1
FEATURES  
APPLICATIONS  
Cellular Phones  
23  
4-Wire Touch Screen Interface  
Portable Instruments  
MP3 Players, Pagers  
Multiscreen Touch Control  
Ratiometric Conversion  
Single 1.2V to 3.6V Supply  
Preprocessing to Reduce Bus Activity  
High-Speed I2C-Compatible Interface  
Internal Detection of Screen Touch  
Register-Based Programmable:  
DESCRIPTION  
The TSC2014 is a very low-power touch screen  
controller designed to work with power-sensitive,  
handheld applications that are based on advanced  
low-voltage processors. It works with a supply voltage  
as low as 1.2V, which can be supplied by a  
10-Bit or 12-Bit Resolution  
Sampling Rates  
System Timing  
single-cell battery. It contains  
a
complete,  
On-Chip Temperature Measurement  
Touch Pressure Measurement  
Auto Power-Down Control  
Low Power:  
ultralow-power, 12-bit, analog-to-digital (A/D) resistive  
touch screen converter, including drivers and the  
control logic to measure touch pressure.  
In addition to these standard features, the TSC2014  
offers  
preprocessing of  
the touch screen  
430mW at 1.8V, 50SSPS  
measurements to reduce bus loading, thus reducing  
the consumption of host processor resources that can  
then be redirected to more critical functions.  
The TSC2014 supports an I2C serial bus and data  
transmission protocol in all three defined modes:  
320mW at 1.6V, 50SSPS  
190mW at 1.2V, 50SSPS  
58mW at 1.6V, 8.2kSPS Eq. Rate  
37mW at 1.2V, 8.2kSPS Eq. Rate  
standard,  
fast,  
and  
high-speed.  
It  
offers  
Enhanced ESD Protection:  
programmable resolution of 10 or 12 bits to  
accommodate different screen sizes and performance  
needs.  
±8kV HBM  
±1kV CDM  
±25kV Air Gap Discharge  
±11kV Contact Discharge  
The TSC2014 is available in a miniature, 12-lead,  
3 x 4 array, (1.555 ±0.055)mm x (2.055 ±0.055)mm  
wafer chip-scale package (WCSP) package. The  
device is characterized for the –40°C to +85°C  
industrial temperature range.  
1.5 x 2.0 WCSP-12 Package  
U.S. Patent No. 6,246,394; other patents pending.  
PENIRQ  
PINTDAV  
DAV  
VDD/REF  
X+  
Touch  
SCL  
X-  
Y+  
Y-  
Screen  
Drivers  
I2C  
SAR  
ADC  
Interface  
Mux  
SDA  
AD0  
Serial  
Interface  
and  
TEMP  
Control  
AUX  
Internal  
Clock  
RESET  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
I2C is a trademark of NXP Semiconductors.  
2
3
All other trademarks are the property of their respective owners.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2010, Texas Instruments Incorporated  

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