TPS50601-DIE
www.ti.com
SLVSC37 –JUNE 2013
1.6-V TO 6.3-V INPUT, 6-A SYNCHRONOUS STEP DOWN SWIFT™ CONVERTER
Check for Samples: TPS50601-DIE
1
FEATURES
2
•
Split Power Rail: 1.6 V to 6.3 V on PVIN
•
•
Adjustable Slow Start and Power Sequencing
•
•
Power Rail: 3 V to 6.3 V on VIN
Power Good Output Monitor for Undervoltage
and Overvoltage
Flexible Switching Frequency Options:
•
Adjustable Input Undervoltage Lockout
–
–
–
Adjustable Internal Oscillator
External Sync Capability
APPLICATIONS
Sync Pin Can Be Configured as a 500-kHz
Output for Master/Slave Applications
•
Point of Load Regulation
•
Monotonic Start-Up into Pre-Biased Outputs
DESCRIPTION
The TPS50601-DIE is a 6.3-V, 6-A synchronous step down converter which is optimized for small designs
through high efficiency and integrating the high-side and low-side MOSFETs. Further space savings are
achieved through current mode control, which reduces component count, and a high switching frequency,
reducing the inductor's footprint.
The output voltage startup ramp is controlled by the SS/TR pin which allows operation as either a stand alone
power supply or in tracking situations. Power sequencing is also possible by correctly configuring the enable and
the open drain power good pins.
Cycle by cycle current limiting on the high-side FET protects the device in overload situations and is enhanced
by a low-side sourcing current limit which prevents current runaway. There is also a low-side sinking current limit
which turns off the low-side MOSFET to prevent excessive reverse current. Thermal shutdown disables the part
when die temperature exceeds thermal shutdown temperature.
ORDERING INFORMATION(1)
PACKAGE
DESIGNATOR
PRODUCT
PACKAGE
ORDERABLE PART NUMBER
PACKAGE QUANTITY
TPS50601VTDC1
TPS50601VTDC2
77
10
TPS50601
TD
Bare die in waffle pack(2)
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Processing is per the Texas Instruments space production baseline and is in compliance with the Texas Instruments Quality Control
System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room temperature
only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not warranted. Visual
Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2
SWIFT is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013, Texas Instruments Incorporated