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SZNUP4114 PDF预览

SZNUP4114

更新时间: 2024-02-12 12:52:32
品牌 Logo 应用领域
安森美 - ONSEMI /
页数 文件大小 规格书
9页 138K
描述
Transient Voltage Suppressors

SZNUP4114 数据手册

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NUP4114 Series,  
SZNUP4114 Series  
Transient Voltage  
Suppressors  
ESD Protection Diodes with Low  
Clamping Voltage  
http://onsemi.com  
The NUP4114 transient voltage suppressors are designed to protect  
high speed data lines from ESD. Ultra−low capacitance and high level  
of ESD protection make these devices well suited for use in USB 2.0  
high speed applications.  
5
1
6
3
4
Features  
Low Clamping Voltage  
Small Body Outline Dimensions on SC−88 Package:  
0.082x 0.078(2.10 mm x 1.25 mm)  
2
Low Body Height: 0.043(1.10 mm)  
MARKING  
DIAGRAMS  
Stand−off Voltage: 5.5 V  
Low Leakage  
Response Time is Typically < 1.0 ns  
IEC61000−4−2 Level 4 ESD Protection  
These Devices are Pb−Free and are RoHS Compliant  
AEC−Q101 Qualified and PPAP Capable − SZNUP4114  
6
SC−88  
W1 SUFFIX  
CASE 419B  
X2 MG  
G
1
1
1
6
SZ Prefix for Automotive and Other Applications Requiring Unique  
Site and Control Change Requirements  
SC−88  
W1 SUFFIX  
CASE 419B  
Typical Applications  
X4 MG  
G
LVDS  
USB 2.0 High Speed Data Line and Power Line Protection  
Digital Video Interface (DVI) and HDMI  
Monitors and Flat Panel Displays  
High Speed Communication Line Protection  
Notebook Computers  
1
6
TSOP−6  
CASE 318G  
STYLE 12  
P4H MG  
G
1
1
Gigabit Ethernet  
MAXIMUM RATINGS (T = 25°C unless otherwise noted)  
SOT−563  
CASE 463A  
6
J
P4MG  
G
Rating  
Symbol  
Value  
40 to +125  
55 to +150  
260  
Unit  
°C  
1
1
Operating Junction Temperature Range  
Storage Temperature Range  
T
J
XXX = Specific Device Code  
T
stg  
°C  
M
G
= Date Code  
= Pb−Free Package  
Lead Solder Temperature −  
Maximum (10 Seconds)  
T
L
°C  
(Note: Microdot may be in either location)  
IEC 61000−4−2 (ESD)  
Contact  
Air  
8
15  
kV  
ORDERING INFORMATION  
See detailed ordering and shipping information in the package  
dimensions section on page 4 of this data sheet.  
Stresses exceeding those listed in the Maximum Ratings table may damage the  
device. If any of these limits are exceeded, device functionality should not be  
assumed, damage may occur and reliability may be affected.  
See Application Note AND8308/D for further description of survivability specs.  
© Semiconductor Components Industries, LLC, 2014  
1
Publication Order Number:  
September, 2014 − Rev. 3  
NUP4114/D  

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