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STM6510WCACDG6F PDF预览

STM6510WCACDG6F

更新时间: 2024-02-25 15:00:01
品牌 Logo 应用领域
意法半导体 - STMICROELECTRONICS 电源电路电源管理电路光电二极管
页数 文件大小 规格书
26页 376K
描述
Dual push-button Smart ResetTM with capacitor-adjustable delays

STM6510WCACDG6F 技术参数

是否Rohs认证:符合生命周期:Active
零件包装代码:DFN包装说明:VSON, SOLCC8,.08,20
针数:8Reach Compliance Code:compliant
ECCN代码:EAR99HTS代码:8542.39.00.01
Factory Lead Time:10 weeks风险等级:5.65
Is Samacsys:N可调阈值:NO
模拟集成电路 - 其他类型:POWER SUPPLY SUPPORT CIRCUITJESD-30 代码:S-PDSO-N8
JESD-609代码:e3长度:2 mm
湿度敏感等级:1信道数量:1
功能数量:1端子数量:8
最高工作温度:85 °C最低工作温度:-40 °C
封装主体材料:PLASTIC/EPOXY封装代码:VSON
封装等效代码:SOLCC8,.08,20封装形状:SQUARE
封装形式:SMALL OUTLINE, VERY THIN PROFILE峰值回流温度(摄氏度):260
电源:1/5.5 V认证状态:Not Qualified
座面最大高度:0.8 mm子类别:Power Management Circuits
最大供电电流 (Isup):0.0024 mA最大供电电压 (Vsup):5.5 V
最小供电电压 (Vsup):1 V标称供电电压 (Vsup):3 V
表面贴装:YES温度等级:INDUSTRIAL
端子面层:Matte Tin (Sn) - annealed端子形式:NO LEAD
端子节距:0.5 mm端子位置:DUAL
阈值电压标称:+1.665V处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:2 mmBase Number Matches:1

STM6510WCACDG6F 数据手册

 浏览型号STM6510WCACDG6F的Datasheet PDF文件第2页浏览型号STM6510WCACDG6F的Datasheet PDF文件第3页浏览型号STM6510WCACDG6F的Datasheet PDF文件第4页浏览型号STM6510WCACDG6F的Datasheet PDF文件第5页浏览型号STM6510WCACDG6F的Datasheet PDF文件第6页浏览型号STM6510WCACDG6F的Datasheet PDF文件第7页 
STM6510  
Dual push-button Smart ResetTM with capacitor-adjustable delays  
Features  
Dual Smart Reset™ push-button inputs with  
capacitor-adjustable extended reset setup  
delay (t  
)
SRC  
Capacitor-adjustable reset pulse duration  
(t  
)
REC  
Power-on reset  
– RST active-low, open-drain  
Factory-programmable thresholds to monitor  
TDFN8 (DG)  
2 mm x 2 mm  
V
in the range of 1.575 to 4.625 V typ.  
CC  
Operating voltage 1.0 V (active-low output  
valid) to 5.5 V  
Low supply current (1.4 µA)  
Applications  
Operating temperature: industrial grade –40 °C  
to +85 °C  
Mobile phones, smartphones  
e-books  
TDFN8 package: 2 mm x 2 mm x 0.75 mm  
RoHS compliant  
MP3 players  
Games  
Portable navigation devices  
Any application that requires delayed reset  
push-button(s) response for improved system  
stability  
February 2010  
Doc ID 16788 Rev 2  
1/26  
www.st.com  
1

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