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SPXD2010VMM120R PDF预览

SPXD2010VMM120R

更新时间: 2022-02-26 10:40:14
品牌 Logo 应用领域
飞思卡尔 - FREESCALE 微控制器
页数 文件大小 规格书
30页 137K
描述
32-bit Power Architecture® Microcontrollers for Highly Reliable

SPXD2010VMM120R 数据手册

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Features  
— Selectable pull-up, pull-down or no pull on all pins on all SIU controlled pins  
— Selectable open drain  
Redundant temperature sensors in separate safety channels  
Multiple low/high voltage detector and inhibit units  
— High voltage detection and inhibit with off-line testing capability on 1.2 V only  
— Low voltage detection and inhibit with off-line testing capability on 1.2 V and 3.3 V supply  
Redundant bandgap to duplicate internal reference  
Deep N-well and wide column multiplexing where required to reduce Soft error rate (SER) effect  
for SRAM  
Physical separation of replicated functional blocks achieved by layout  
2.4  
Modes of Operation  
PXS20 devices can operate in two modes of operation:  
Lock Step Mode (LSM)  
Decoupled Parallel Mode (DPM)  
One of the two modes is statically selected at power-up. The selected mode may be changed only going  
through a full power-on reset.  
2.4.1  
Lock Step Mode (LSM)  
Lock Step Mode (LSM) allows reaching the highest safety level. It has been defined to allow reaching  
SIL3 with minimum software overhead.  
The Sphere of Replication (SoR) refers to a set of replicated IP modules where at the outputs a formal  
check is performed to ensure that the same operations or transactions are executed on a clock per clock  
basis (Lock Step Mode of operation).  
The current concept assumes as premise that the most important goal for a functional safety SIL3-capable  
device is to detect (or diagnose) faults as they leave the SoR. In fact, a fault as long as it remains confined  
within the SoR and therefore will not generate an action visible outside the SoC or influence the effective  
operability of the periphery (and so the ECU), is not to be considered as a dangerous fault.  
The presence of checkers (RC) at the outputs of the SoR for the periphery bus, the flash-memory  
subsystem and the SRAM subsystem represents a minimum guarantee that non-common cause faults are  
detected when the two channels redundantly are merged into a single actuator or recipient, on the action  
that is to be performed.  
2.4.2  
Decoupled Parallel Mode (DPM)  
In Decoupled Parallel Mode (DPM) , each CPU core and connected channel run independently from the  
other one and redundancy checkers (RC) are disabled.  
PXS20 Product Brief, Rev. 1  
Freescale Semiconductor  
7

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