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SN74HC253-EP PDF预览

SN74HC253-EP

更新时间: 2024-09-30 11:58:31
品牌 Logo 应用领域
德州仪器 - TI 复用器输出元件
页数 文件大小 规格书
12页 347K
描述
DUAL 4-LINE TO 1-LINE DATA SELECTOR/MULTIPLEXER WITH 3-STATE OUTPUTS

SN74HC253-EP 数据手册

 浏览型号SN74HC253-EP的Datasheet PDF文件第2页浏览型号SN74HC253-EP的Datasheet PDF文件第3页浏览型号SN74HC253-EP的Datasheet PDF文件第4页浏览型号SN74HC253-EP的Datasheet PDF文件第5页浏览型号SN74HC253-EP的Datasheet PDF文件第6页浏览型号SN74HC253-EP的Datasheet PDF文件第7页 
ꢀꢁ ꢂꢃ ꢄꢅ ꢆꢇ ꢈꢉ ꢊꢋ  
ꢌꢍꢎ ꢏ ꢃ ꢉꢏ ꢐꢁꢊ ꢑ ꢒ ꢓ ꢉꢏ ꢐꢁꢊ ꢌꢎꢑꢎ ꢀꢊ ꢏꢊ ꢅꢑꢒ ꢔꢕꢖ ꢍꢏꢑꢐ ꢋ ꢏꢊ ꢗꢊ ꢔ  
ꢘ ꢐꢑ ꢄ ꢈ ꢉꢀꢑꢎꢑ ꢊ ꢒ ꢍꢑ ꢋꢍ ꢑꢀ  
SCLS560 − JANUARY 2004  
D
Controlled Baseline  
− One Assembly/Test Site, One Fabrication  
Site  
D
D
D
D
D
Low Power Consumption, 80-µA Max I  
Typical t = 9 ns  
pd  
6-mA Output Drive at 5 V  
CC  
D
D
D
D
D
D
D
Extended Temperature Performance of  
−40°C to 125°C  
Enhanced Diminishing Manufacturing  
Sources (DMS) Support  
Low Input Current of 1 µA Max  
Permit Multiplexing From n Lines to One  
Line  
D
Perform Parallel-to-Serial Conversion  
Enhanced Product-Change Notification  
Qualification Pedigree  
D PACKAGE  
(TOP VIEW)  
3-State Version of ’HC153  
Wide Operating Voltage Range of 2 V to 6 V  
16  
15  
14  
13  
12  
11  
10  
9
1
2
3
4
5
6
7
8
1OE  
B
V
CC  
2OE  
High-Current Inverting Outputs Drive Up To  
15 LSTTL Loads  
1C3  
1C2  
1C1  
1C0  
1Y  
A
Component qualification in accordance with JEDEC and industry  
standards to ensure reliable operation over an extended  
temperature range. This includes, but is not limited to, Highly  
Accelerated Stress Test (HAST) or biased 85/85, temperature  
cycle, autoclave or unbiased HAST, electromigration, bond  
intermetallic life, and mold compound life. Such qualification  
testing should not be viewed as justifying use of this component  
beyond specified performance and environmental limits.  
2C3  
2C2  
2C1  
2C0  
2Y  
GND  
description/ordering information  
Each data selector/multiplexer contains inverters and drivers to supply full binary decoding data selection to the  
AND-OR gates. Separate output-control inputs are provided for each of the two 4-line sections.  
The 3-state outputs can interface with and drive data lines of bus-organized systems. With all but one of the  
common outputs disabled (in the high-impedance state), the low impedance of the single enabled output drives  
the bus line to a high or low logic level. Each output has its own output-enable (OE) input. The outputs are  
disabled when their respective OE is high.  
ORDERING INFORMATION  
ORDERABLE  
PART NUMBER  
TOP-SIDE  
MARKING  
T
A
PACKAGE  
−40°C to 125°C  
SOIC − D Tape and reel  
SN74HC253QDREP  
SHC253QEP  
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design  
guidelines are available at www.ti.com/sc/package.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
ꢑꢤ  
Copyright 2004, Texas Instruments Incorporated  
ꢠ ꢤ ꢡ ꢠꢙ ꢚꢮ ꢜꢛ ꢟ ꢧꢧ ꢥꢟ ꢝ ꢟ ꢞ ꢤ ꢠ ꢤ ꢝ ꢡ ꢩ  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  

SN74HC253-EP 替代型号

型号 品牌 替代类型 描述 数据表
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