SN54ALS22B, SN74ALS22B
DUAL 4-INPUT POSITIVE-NAND GATES
WITH OPEN-COLLECTOR OUTPUTS
SDAS005A – MARCH 1984 – REVISED MAY 1986
• Package Options Include Plastic Small
Outline Packages, Ceramic Chip Carriers,
and Standard Plastic and Ceramic 300-mil
DIPs
SN54ALS22B . . . J PACKAGE
SN74ALS22B . . . D OR N PACKAGE
(TOP VIEW)
1A
1B
NC
1C
1D
1Y
V
1
2
3
4
5
6
7
14
13
12
11
10
9
CC
• Dependable Texas Instruments Quality and
2D
2C
NC
2B
2A
2Y
Reliability
description
These devices contain two independent 4-input
NAND gates. They perform the Boolean functions
Y = A•B•C•D or Y = A+B+C+D in positive logic.
The open-collector outputs require pullup
resistors to perform correctly. They may be
connected to other open-collector outputs to
implement active-low wired-OR or active-high
wired-AND functions. Open-collector devices are
GND
8
SN54ALS22B . . . FK PACKAGE
(TOP VIEW)
often used to generate higher V
levels.
OH
3
2
1
20 19
18
The SN54ALS22B is characterized for operation
over the full military temperature range of 55°C
to 125°C. The SN74ALS22B is characterized for
operation from 0°C to 70°C.
2C
NC
NC
NC
2B
NC
NC
1C
NC
1D
4
5
6
7
8
17
16
15
14
FUNCTION TABLE
(each gate)
9 10 11 12 13
INPUTS
OUTPUT
A
H
L
B
C
H
X
X
L
D
H
X
X
X
L
Y
L
H
X
L
NC–No internal connection
H
H
H
H
X
X
X
logic diagram (positive logic)
X
X
X
1A
†
1B
1C
logic symbol
1Y
1
&
1A
1D
2
6
1B
1Y
2Y
2A
4
1C
2B
2C
5
2Y
1D
9
2A
2D
8
10
2B
12
2C
13
2D
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
Pin numbers shown are for D, J, and N packages.
Copyright 1986, Texas Instruments Incorporated
5BASIC
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
1
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