SN74ABTH32543-EP
36-BIT REGISTERED BUS TRANSCEIVER
WITH 3-STATE OUTPUTS
SCBS757 – AUGUST 2002
Controlled Baseline
State-of-the-Art EPIC-ΙΙB BiCMOS Design
– One Assembly/Test Site, One Fabrication
Site
Significantly Reduces Power Dissipation
Typical V
<0.8 V at V
(Output Ground Bounce)
OLP
Extended Temperature Performance of
–55°C to 125°C
= 5 V, T = 25°C
CC A
High-Impedance State During Power Up
and Power Down
Enhanced Diminishing Manufacturing
Sources (DMS) Support
Distributed V
Minimizes High-Speed Switching Noise
and GND Pin Configuration
CC
Enhanced Product Change Notification
†
Qualification Pedigree
High-Drive Outputs (–32-mA I , 64-mA I
OH
)
OL
Member of the Texas Instruments
Widebus+ Family
Bus Hold on Data Inputs Eliminates the
Need for External Pullup/Pulldown
Resistors
†
Component qualification in accordance with JEDEC and industry
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, Highly
Accelerated Stress Test (HAST) or biased 85/85, temperature
cycle, autoclave or unbiased HAST, electromigration, bond
intermetallic life, and mold compound life. Such qualification
testing should not be viewed as justifying use of this component
beyond specified performance and environmental limits.
100-Pin Plastic Thin Quad Flat (PZ)
Package With 14- × 14-mm Body Using
0.5-mm Lead Pitch
description
The’ABTH32543isa36-bitregisteredtransceiverthatcontainstwosetsofD-typelatchesfortemporarystorage
of data flowing in either direction. This device can be used as two 18-bit transceivers or one 36-bit transceiver.
Separate latch-enable (LEAB or LEBA) and output-enable (OEAB or OEBA) inputs are provided for each
register to permit independent control in either direction of data flow.
The A-to-B enable (CEAB) input must be low to enter data from A or to output data from B. If CEAB is low and
LEAB is low, the A-to-B latches are transparent; a subsequent low-to-high transition of LEAB puts the A latches
inthestoragemode. WithCEABandOEABbothlow, the3-stateBoutputsareactiveandreflectthedatapresent
at the output of the A latches. Data flow from B to A is similar, but requires using the CEBA, LEBA, and
OEBA inputs.
When V
is between 0 and 2.1 V, the device is in the high-impedance state during power up or power down.
CC
However, to ensure the high-impedance state above 2.1 V, OE should be tied to V
the minimum value of the resistor is determined by the current-sinking capability of the driver.
through a pullup resistor;
CC
Active bus-hold circuitry holds unused or floating data inputs at a valid logic level.
ORDERING INFORMATION
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
‡
T
A
PACKAGE
–55°C to 125°C
LQFP – PZ
SN74ABTH32543MPZEP
74ABTH32543MEP
‡
Package drawings, standard packing quantities, thermal data, symbolization, and PCB
design guidelines are available at www.ti.com/sc/package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Widebus+ and EPIC-ΙΙB are trademarks of Texas Instruments.
Copyright 2002, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
1
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