SN65HVD50-SN65HVD55
SN65HVD56-SN65HVD59
www.ti.com
SLLS666–SEPTEMBER 2005
DRIVER SWITCHING CHARACTERISTICS
over recommended operating conditions unless otherwise noted
PARAMETER
TEST CONDITIONS
MIN
4
TYP(1)
8
MAX UNIT
HVD50, HVD53, HVD56, HVD58
Propagation delay time,
12
tPLH
tPHL
tr
HVD51, HVD54, HVD57, HVD59
HVD52, HVD55
20
90
4
29
46
230
12
46
230
12
60
300
11
60
300
2
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
low-to-high-level output
143
8
HVD50, HVD53, HVD56, HVD58
HVD51, HVD54, HVD57, HVD59
HVD52, HVD55
Propagation delay time,
high-to-low-level output
20
90
3
30
143
6
HVD50, HVD53, HVD56, HVD58
HVD51, HVD54, HVD57, HVD59
HVD52, HVD55
Differential output signal
rise time
25
130
3
34
197
6
RL = 54 Ω, CL = 50 pF,
See Figure 5
HVD50, HVD53, HVD56, HVD58
HVD51, HVD54, HVD57, HVD59
HVD52, HVD55
Differential output signal fall
time
tf
25
130
33
192
HVD50, HVD53, HVD56, HVD58
HVD51, HVD54, HVD57, HVD59
HVD52, HVD55
tsk(p)
tsk(pp)
tPZH1
tPHZ
tPZL1
tPLZ
tPZH2
tPZL2
Pulse skew (|tPHL - tPLH|)
Part-to-part skew
2
8
HVD50, HVD53, HVD56, HVD58
HVD51, HVD54, HVD57, HVD59
HVD52, HVD55
1
4
(2)
22
HVD53, HVD58
30
180
380
16
Propagation delay time,
high-impedance-to-high-
level output
HVD54, HVD59
RL = 110 Ω, RE at 0 V,
See Figure 6
D = 3 V and S1 = Y,
D = 0 V and S1 = Z
HVD55
HVD53, HVD58
Propagation delay time,
high-level-to-high-
HVD54, HVD59
40
impedance output
HVD55
110
23
HVD53, HVD58
Propagation delay time,
high-impedance-to-low-level HVD54, HVD59
200
420
19
RL = 110 Ω, RE at 0 V,
See Figure 7
D = 3 V and S1 = Z,
D = 0 V and S1 = Y
output
HVD55
HVD53, HVD58
Propagation delay time,
low-level-to-high-impedance HVD54, HVD59
70
output
HVD55
160
RL = 110 Ω, RE at 3 V,
See Figure 6
D = 3 V and S1 = Y,
D = 0 V and S1 = Z
Propagation delay time, standby-to-high-level output
Propagation delay time, standby-to-low-level output
3300
3300
RL = 110 Ω, RE at 3 V,
See Figure 7
D = 3 V and S1 = Z,
D = 0 V and S1 = Y
(1) All typical values are at 25°C and with a 5-V supply.
(2) tsk(pp) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices
operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.
5