Datasheet > SMMUN2238LTIG

SMMUN2238LTIG

更新时间： 2024-09-27 11:58:43

品牌	Logo	应用领域
安森美 - ONSEMI		晶体数字晶体管
页数	文件大小	规格书
7页	111K
描述
Digital Transistors (BRT) R1 = 2.2 k, R2 = k

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SMMUN2238LTIG 数据手册

MMUN2238L, NSBC123TF3

Digital Transistors (BRT)

R1 = 2.2 kW, R2 = 8 kW

NPN Transistors with Monolithic Bias

Resistor Network

http://onsemi.com

PIN CONNECTIONS

This series of digital transistors is designed to replace a single

device and its external resistor bias network. The Bias Resistor

Transistor (BRT) contains a single transistor with a monolithic bias

network consisting of two resistors; a series base resistor and a base−

emitter resistor. The BRT eliminates these individual components by

integrating them into a single device. The use of a BRT can reduce

both system cost and board space.

PIN 3

COLLECTOR

(OUTPUT)

PIN 1

BASE

(INPUT)

PIN 2

EMITTER

(GROUND)

Features

• Simplifies Circuit Design

• Reduces Board Space

• Reduces Component Count

MARKING DIAGRAMS

• S and NSV Prefix for Automotive and Other Applications Requiring

Unique Site and Control Change Requirements; AEC-Q101 Qualified

and PPAP Capable

SOT−23

CASE 318

STYLE 6

XXX MG

• These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS

Compliant

SOT−1123

CASE 524AA

STYLE 1

X M

MAXIMUM RATINGS (T = 25°C)

XXX

= Specific Device Code

Rating

Collector−Base Voltage

Collector−Emitter Voltage

Collector Current − Continuous

Input Forward Voltage

Symbol

Max

Unit

Vdc

Date Code*

Pb−Free Package

CBO

CEO

Vdc

(Note: Microdot may be in either location)

100

mAdc

Vdc

*Date Code orientation may vary depending

upon manufacturing location.

IN(fwd)

Input Reverse Voltage

Vdc

IN(rev)

ORDERING INFORMATION

See detailed ordering, marking, and shipping information in

the package dimensions section on page 2 of this data sheet.

Stresses exceeding Maximum Ratings may damage the device. Maximum

Ratings are stress ratings only. Functional operation above the Recommended

Operating Conditions is not implied. Extended exposure to stresses above the

Recommended Operating Conditions may affect device reliability.

Publication Order Number:

August, 2012 − Rev. 0

DTC123T/D

12 3 4 5 6 7

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