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S7031-0907S PDF预览

S7031-0907S

更新时间: 2024-02-10 11:25:31
品牌 Logo 应用领域
HAMAMATSU 传感器换能器图像传感器
页数 文件大小 规格书
12页 237K
描述
Back-thinned FFT-CCD

S7031-0907S 技术参数

是否Rohs认证:符合生命周期:Active
Reach Compliance Code:unknown风险等级:5.7
Is Samacsys:N其他特性:SENSITIVITY 2.2 MICRO V/ELECTRON
阵列类型:LINEAR主体宽度:22.9 mm
主体高度:7.7 mm主体长度或直径:50 mm
数据速率:1 Mbps动态范围:101.93 dB
水平像素:512外壳:CERAMIC
安装特点:THROUGH HOLE MOUNT最大工作电流:100 mA
最高工作温度:30 °C最低工作温度:-50 °C
输出范围:14-18V输出类型:ANALOG VOLTAGE
封装形状/形式:RECTANGULAR像素大小:24X24 µm
传感器/换能器类型:IMAGE SENSOR,CCD光谱响应 (nm):200-1100
最大供电电压:22 V最小供电电压:18 V
表面贴装:NO端接类型:SOLDER
垂直像素:122Base Number Matches:1

S7031-0907S 数据手册

 浏览型号S7031-0907S的Datasheet PDF文件第1页浏览型号S7031-0907S的Datasheet PDF文件第2页浏览型号S7031-0907S的Datasheet PDF文件第4页浏览型号S7031-0907S的Datasheet PDF文件第5页浏览型号S7031-0907S的Datasheet PDF文件第6页浏览型号S7031-0907S的Datasheet PDF文件第7页 
CCD area image sensors  
S7030/S7031 series  
Electrical characteristics (Ta=25 °C)  
Parameter  
Symbol  
fc  
Min.  
Typ.  
0.25  
750  
1500  
3000  
110  
180  
30  
Max.  
1
-
-
-
Unit  
MHz  
Signal output frequency  
-
-
-
-
S703 -0906  
S703 -0907/-1006  
S703 -1007  
S703 -0906/-0907  
*
*
*
*
Vertical shift register  
capacitance  
CP1V, CP2V  
pF  
Horizontal shift register  
capacitance  
CP1H, CP2H  
-
-
pF  
S703 -1006/-1007  
*
Summing gate capacitance  
Reset gate capacitance  
CSG  
CRG  
-
-
-
-
pF  
pF  
30  
S703 -0906/-0907  
55  
75  
0.99999  
16  
*
Transfer gate capacitance  
CTG  
-
-
pF  
S703 -1006/-1007  
*
Charge transfer ef¿ciency*3  
DC output level*4  
Output impedance*4  
Power consumption*4 *5  
CTE  
Vout  
Zo  
0.99995  
-
18  
4
-
V
k:  
mW  
14  
-
-
3
13  
P
14  
*3: Charge transfer ef¿ciency per pixel, measured at half of the full well capacity  
*4: The values depend on the load resistance. (Typical, VOD=20 V, Load resistance=22 k:)  
*5: Power consumption of the on-chip ampli¿er plus load resistance  
Electrical and optical characteristics (Ta=25 °C, unless otherwise noted)  
Parameter  
Saturation output voltage  
Symbol  
Vsat  
Min.  
-
Typ.  
Fw × Sv  
Max.  
-
Unit  
V
Vertical  
240  
800  
1.8  
-
-
-
320  
1000  
2.2  
100  
10  
8
125000  
40000  
-
-
-
Full well capacity  
Fw  
Sv  
ke-  
Horizontal*6  
CCD node sensitivity  
Dark current*7  
(MPP mode)  
Readout noise*8  
—V/e-  
25 °C  
0 °C  
1000  
100  
16  
-
DS  
Nr  
e-/pixel/s  
e- rms  
Line binning  
Area scanning  
Photo response non-uniformity*10  
100000  
30000  
-
-
%
nm  
-
-
-
-
Dynamic range*9  
DR  
-
PRNU  
O
-
-
-
-
-
-
±3  
±10  
-
0
10  
3
0
Spectral response range  
200 to 1100  
White spots  
Black spots  
-
-
-
-
Point defect*11  
Blemish  
-
Cluster defect*12  
Column defect*13  
*6: The linearity is ±1.5%.  
*7: Dark current nearly doubles for every 5 to 7 °C increase in temperature.  
*8: Measured with a HAMAMATSU C4880 digital CCD camera with a CDS circuit (sensor temperature: -40 °C, operating frequency:  
150 kHz)  
*9: Dynamic range = Full well capacity / Readout noise  
*10: Measured at one-half of the saturation output (full well capacity) using LED light (peak emission wavelength: 560 nm)  
Fixed pattern noise (peak to peak)  
Photo response non-uniformity =  
× 100 [%]  
Signal  
*11: White spots  
-
Pixels whose dark current is higher than 1 ke after one-second integration at 0 °C.  
Black spots  
Pixels whose sensitivity is lower than one-half of the average pixel output. (measured with uniform light producing one-half of the  
saturation charge)  
*12: 2 to 9 contiguous defective pixels  
*13: 10 or more contiguous defective pixels  
3

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