v2.0
54SX Family FPGAs
RadTolerant and HiRel
High Density Devices
Features
• 16,000 and 32,000 Available Logic Gates
RadTolerant 54SX Family
• Up to 228 User I/Os
• Tested Total Ionizing Dose (TID) Survivability Level
• Up to 1,080 Dedicated Flip-Flops
• Radiation Performance to 100Krads (Si) (ICC Standby
Parametric)
Easy Logic Integration
• Devices Available from Tested Pedigreed Lots
• Up to 160 MHz On-Chip Performance
• Offered as Class B and E-Flow (Actel Space Level Flow)
• QMl Certified Devices
• Non-Volatile, User Programmable
• Highly Predictable Performance with 100% Automatic
Place and Route
• 100% Resource Utilization with 100% Pin Locking
• Mixed Voltage Support—3.3V Operation with 5.0V Input
Tolerance for Low Power Operation
HiRel 54SX Family
• Fastest HiRel FPGA Family Available
• JTAG Boundary Scan Testing in Compliance with IEEE
Standard 1149.1
• Up to 240 MHz On-Chip Performance
• Low Cost Prototyping Vehicle for RadTolerant Devices
• Secure Programming Technology Prevents Reverse
Engineering and Design Theft
• Offered as Commercial or Military Temperature Tested
and Class B
• Permanently Programmed for Operation on Power-Up
• Cost Effective QML MIL-Temp Plastic Packaging Options
• Standard Hermetic Packaging Offerings
• QML Certified Devices
• Unique In-System Diagnostic and Debug Facility with
Silicon Explorer
• Supported by Actel’s Designer Series and DeskTOP Series
Development Systems with Automatic Timing Driven
Place and Route
• Predictable, Reliable, and Permanent Antifuse Technology
Performance
SX Product Profile
Device
RT54SX16
A54SX16
RT54SX32
A54SX32
Capacity
System Gates
Logic Gates
24,000
16,000
24,000
16,000
48,000
32,000
48,000
32,000
Logic Modules
Register Cells
Combinatorial Cells
User I/Os (Maximum)
JTAG
1,452
528
924
179
1,452
528
924
180
Yes
2,880
1,080
1,800
227
2,880
1,080
1,800
228
Yes
Yes
Yes
Packages (by pin count)
CQFP
208, 256
208, 256
208, 256
208, 256
March 2001
1
© 2001 Actel Corporation