RS138T
7 SPECIFICATIONS
7.1 Absolute Maximum Ratings (1)
over operating free-air temperature range (unless otherwise noted) (1) (2)
MIN
MAX
UNIT
V
VCC
IIK
Supply voltage range
-0.5
7
Input clamp diode current
Output clamp diode current
For VI < 0.5V or VI > VCC + 0.5V
For VO < -0.5V or VO > VCC +0.5V
mA
mA
mA
mA
±20
±20
±25
±50
150
45
IOK
IO
Output source or sink current per output pin For VO > -0.5V or VO < VCC +0.5V
Continuous current through VCC or GND
SOIC-16(SOP16)
Package thermal impedance (3)
θJA
°C/W
TSSOP-16
TJ
Junction temperature (4)
°C
°C
°C
-65
-65
150
150
300
Tstg
Storage temperature
Lead temperature (Soldering 10s) (SOIC - Lead Tips Only) 300 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The input and output negative-voltage ratings may be exceeded if the input and output current ratings are observed.
(3) The package thermal impedance is calculated in accordance with JESD-51.
(4) The maximum power dissipation is a function of TJ(MAX), RθJA, and TA. The maximum allowable power dissipation at any ambient
temperature is PD = (T J(MAX) - TA) / RθJA. All numbers apply for packages soldered directly onto a PCB.
7.2 ESD Ratings
The following ESD information is provided for handling of ESD-sensitive devices in an ESD protected area only.
VALUE
UNIT
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
Charged-device model (CDM), per ANSI/ESDA/JEDEC JS-002(2)
Machine model (MM)
V
V
V
±2000
±1000
±200
V(ESD) Electrostatic discharge
(1) JEDEC document JEP155 states that 500 V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250 V CDM allows safe manufacturing with a standard ESD control process.
ESD SENSITIVITY CAUTION
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
6 / 16
www.run-ic.com