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RN2702JE(TPL3) PDF预览

RN2702JE(TPL3)

更新时间: 2024-01-08 21:05:21
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
8页 555K
描述
PRE-BIASED "DIGITAL" TRANSISTOR,50V V(BR)CEO,100MA I(C),SOT-353VAR

RN2702JE(TPL3) 数据手册

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RN2701JE~RN2706JE  
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process) (Bias Resistor Built-in Transistor)  
RN2701JE,RN2702JE,RN2703JE  
RN2704JE,RN2705JE,RN2706JE  
Switching, Inverter Circuit, Interface Circuit and  
Unit: mm  
Driver Circuit Applications  
Two devices are incorporated into an Extreme-Super-Mini (5-pin) package.  
Incorporating a bias resistor into a transistor reduces parts count.  
Reducing the parts count enables the manufacture of ever more compact  
equipment and lowers assembly cost.  
Complementary to RN1701JE~RN1706JE  
Equivalent Circuit and Bias Resistor Values  
C
Type No.  
R1 (kΩ)  
R2 (kΩ)  
1.BASE1  
2.EMITTER  
3.BASE2  
4.COLLECTOR2  
5.COLLECTOR1  
(B1)  
(E)  
(B2)  
(C2)  
(C1)  
RN2701JE  
RN2702JE  
RN2703JE  
RN2704JE  
RN2705JE  
RN2706JE  
4.7  
10  
4.7  
10  
22  
47  
47  
47  
R1  
B
22  
47  
JEDEC  
JEITA  
E
2.2  
4.7  
TOSHIBA  
2-2P1D  
Weight: 0.003 g (typ.)  
Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 common)  
Equivalent Circuit  
(top view)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
5
4
V
V
50  
50  
V
V
CBO  
CEO  
RN2701JE~  
2706JE  
Collector-emitter voltage  
Q1  
Q2  
RN2701JE~  
2704JE  
10  
5  
Emitter-base voltage  
V
C
V
EBO  
RN2705JE,  
RN2706JE  
1
2
3
Collector current  
I
100  
100  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
(Note 1)  
RN2701JE~  
2706JE  
T
j
150  
T
55~150  
°C  
stg  
Note: Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in temperature, etc.) may cause this product to  
decrease in the reliability significantly even if the operating conditions (i.e. operating  
temperature/current/voltage, etc.) are within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note 1: Total rating  
1
2007-11-01  

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