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RN1972HFE(TE85L,F) PDF预览

RN1972HFE(TE85L,F)

更新时间: 2023-06-15 00:00:00
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
6页 144K
描述
PRE-BIASED "DIGITAL" TRANSISTOR,40V V(BR)CEO,100MA I(C),TSOP

RN1972HFE(TE85L,F) 数据手册

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RN1972HFE,RN1973HFE  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT process) (Bias Resistor built-in Transistor)  
RN1972HFE,RN1973HFE  
Switching, Inverter Circuit, Interface Circuit and Driver  
Circuit Applications  
Unit: mm  
Two devices are incorporated into an Extreme-Super-Mini (6 pin)  
package.  
Incorporating a bias resistor into a transistor reduces parts count.  
Reducing the parts count enable the manufacture of ever more compact  
equipment and save assembly cost.  
Complementary to RN2972HFE, RN2973HFE  
Equivalent Circuit  
C
R1  
B
E
JEDEC  
JEITA  
TOSHIBA  
22N1A  
Absolute Maximum Ratings (Ta = 25°C)  
(Q1, Q2 common)  
Weight:0.003g (typ.)  
Equivalent Circuit  
(top view)  
Characteristics  
Symbol  
Rating  
Unit  
Collector-base voltage  
Collector-emitter voltage  
Emitter-base voltage  
V
40  
40  
V
V
6
5
4
CBO  
V
CEO  
EBO  
V
5
V
Q2  
Q1  
Collector current  
I
100  
mA  
mW  
°C  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
(Note 1)  
100  
C
T
150  
j
1
2
3
T
stg  
55~150  
Note:  
Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in temperature,  
etc.) may cause this product to decrease in the reliability significantly  
even if the operating conditions (i.e. operating  
temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba  
Semiconductor Reliability Handbook (“Handling  
Precautions”/“Derating Concept and Methods”) and individual  
reliability data (i.e. reliability test report and estimated failure rate,  
etc).  
Note 1: Total rating  
1
2007-11-01  

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