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N01L6183AB7IT PDF预览

N01L6183AB7IT

更新时间: 2024-01-04 03:12:09
品牌 Logo 应用领域
安森美 - ONSEMI 静态存储器
页数 文件大小 规格书
10页 244K
描述
1Mb Ultra-Low Power Asynchronous CMOS SRAM

N01L6183AB7IT 技术参数

是否Rohs认证: 不符合生命周期:Active
零件包装代码:BGA包装说明:LFBGA, BGA48,6X8,30
针数:48Reach Compliance Code:not_compliant
ECCN代码:EAR99HTS代码:8542.32.00.41
风险等级:5.4最长访问时间:85 ns
I/O 类型:COMMONJESD-30 代码:R-PBGA-B48
长度:8 mm内存密度:1048576 bit
内存集成电路类型:STANDARD SRAM内存宽度:16
功能数量:1端子数量:48
字数:65536 words字数代码:64000
工作模式:ASYNCHRONOUS最高工作温度:85 °C
最低工作温度:-40 °C组织:64KX16
输出特性:3-STATE封装主体材料:PLASTIC/EPOXY
封装代码:LFBGA封装等效代码:BGA48,6X8,30
封装形状:RECTANGULAR封装形式:GRID ARRAY, LOW PROFILE, FINE PITCH
并行/串行:PARALLEL电源:1.8 V
认证状态:Not Qualified座面最大高度:1.34 mm
最大待机电流:0.000005 A最小待机电流:1.2 V
子类别:SRAMs最大压摆率:0.016 mA
最大供电电压 (Vsup):2.2 V最小供电电压 (Vsup):1.65 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子形式:BALL端子节距:0.75 mm
端子位置:BOTTOM宽度:6 mm
Base Number Matches:1

N01L6183AB7IT 数据手册

 浏览型号N01L6183AB7IT的Datasheet PDF文件第1页浏览型号N01L6183AB7IT的Datasheet PDF文件第3页浏览型号N01L6183AB7IT的Datasheet PDF文件第4页浏览型号N01L6183AB7IT的Datasheet PDF文件第5页浏览型号N01L6183AB7IT的Datasheet PDF文件第6页浏览型号N01L6183AB7IT的Datasheet PDF文件第7页 
N01L6183A  
Functional Block Diagram  
Word  
Address  
Inputs  
Address  
Decode  
Logic  
A0 - A3  
Input/  
Output  
Mux  
Page  
4K Page  
x 16 word  
x 16 bit  
Address  
Inputs  
Address  
Decode  
Logic  
I/O0 - I/O7  
A4 - A15  
and  
RAM Array  
Buffers  
I/O8 - I/O15  
CE  
WE  
OE  
UB  
LB  
Control  
Logic  
Functional Description  
1
CE  
WE  
OE  
UB  
LB  
MODE  
POWER  
I/O0 - I/O15  
Standby2  
Active  
Write3  
Read  
Active  
H
L
L
L
L
X
X
L
X
X
X3  
X
H
L1  
L1  
L1  
X
H
L1  
L1  
L1  
High Z  
High Z  
Data In  
Data Out  
High Z  
Standby  
Active  
Active -> Standby4  
Active -> Standby4  
Standby4  
H
H
L
H
1. When UB and LB are in select mode (low), I/O0 - I/O15 are affected as shown. When LB only is in the select mode only I/O0 - I/O7  
are affected as shown. When UB is in the select mode only I/O8 - I/O15 are affected as shown.  
2. When the device is in standby mode, control inputs (WE, OE, UB, and LB), address inputs and data input/outputs are internally  
isolated from any external influence and disabled from exerting any influence externally.  
3. When WE is invoked, the OE input is internally disabled and has no effect on the circuit.  
4. The device will consume active power in this mode whenever addresses are changed. Data inputs are internally isolated from any  
external influence.  
1
Capacitance  
Item  
Symbol  
CIN  
Test Condition  
Min  
Max  
8
Unit  
pF  
VIN = 0V, f = 1 MHz, TA = 25oC  
VIN = 0V, f = 1 MHz, TA = 25oC  
Input Capacitance  
I/O Capacitance  
CI/O  
8
pF  
1. These parameters are verified in device characterization and are not 100% tested  
Rev. 8 | Page 2 of 10 | www.onsemi.com  

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