Freescale Semiconductor
Data Sheet: Advance Information
Document Number: PXS20
Rev. 1, 09/2011
PXS20
MAPBGA–225
QFN12
15 mm x 15 mm
##_mm_x_##mm
SOT-343R
##_mm_x_##mm
144 LQFP
PKG-TBD
PXS20 Microcontroller Data
Sheet
## mm x ## mm
TBD
257 MAPBGA
(20 x 20 x 1.4 mm)
(14 x 14 x 0.8 mm)
• GPIOs individually programmable as input, output or
special function
• High-performance e200z4d dual core
®
– 32-bit Power Architecture technology CPU
• Three 6-channel general-purpose eTimer units
• 2 FlexPWM units
– Four 16-bit channels per module
• Communications interfaces
– Core frequency as high as 120 MHz
– Dual issue five-stage pipeline core
– Variable Length Encoding (VLE)
– Memory Management Unit (MMU)
– 4 KB instruction cache with error detection code
– Signal processing engine (SPE)
– 2 LINFlexD channels
– 3 DSPI channels with automatic chip select generation
– 2 FlexCAN interfaces (2.0B Active) with 32 message
objects
• Memory available
– 1 MB flash memory with ECC
– FlexRay module (V2.1 Rev. A) with 2 channels, 64
message buffers and data rates up to 10 Mbit/s
• Two 12-bit analog-to-digital converters (ADCs)
– 16 input channels
– 128 KB on-chip SRAM with ECC
– Built-in RWW capabilities for EEPROM emulation
• SIL3/ASILD innovative safety concept: LockStep mode
and Fail-safe protection
– Programmable cross triggering unit (CTU) to
synchronize ADCs conversion with timer and PWM
• Sine wave generator (D/A with low pass filter)
• On-chip CAN/UART bootstrap loader
• Single 3.0 V to 3.6 V voltage supply
• Ambient temperature range –40 °C to 125 °C
• Junction temperature range –40 °C to 150 °C
– Sphere of replication (SoR) for key components (such as
CPU core, eDMA, crossbar switch)
– Fault collection and control unit (FCCU)
– Redundancy control and checker unit (RCCU) on
outputs of the SoR connected to FCCU
– Boot-time Built-In Self-Test for Memory (MBIST) and
Logic (LBIST) triggered by hardware
– Boot-time Built-In Self-Test for ADC and flash memory
triggered by software
– Replicated safety enhanced watchdog
– Replicated junction temperature sensor
– Non-maskable interrupt (NMI)
– 16-region memory protection unit (MPU)
– Clock monitoring units (CMU)
– Power management unit (PMU)
– Cyclic redundancy check (CRC) unit
• Decoupled Parallel mode for high-performance use of
replicated cores
• Nexus Class 3+ interface
• Interrupts
– Replicated 16-priority controller
– Replicated 16-channel eDMA controller
This document contains information on a product under development. Freescale reserves the
right to change or discontinue this product without notice.
© Freescale Semiconductor, Inc., 2011. All rights reserved.
Preliminary—Subject to Change Without Notice
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