Datasheet > MC12026A_06

MC12026A_06

更新时间： 2022-04-23 23:00:11

品牌	Logo	应用领域
安森美 - ONSEMI		预分频器
页数	文件大小	规格书
6页	130K
描述
1.1 GHz Dual Modulus Prescaler

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MC12026A_06 数据手册

MC12026A

1.1 GHz Dual Modulus

Prescaler

Description

The MC12026 is a high frequency, low voltage dual modulus

prescaler used in phase−locked loop (PLL) applications.

The MC12026A can be used with CMOS synthesizers requiring

positive edges to trigger internal counters in a PLL to provide tuning

signals up to 1.1 GHz in programmable frequency steps.

A Divide Ratio Control (SW) permits selection of an 8/9 or 16/17

divide ratio as desired.

http://onsemi.com

MARKING

DIAGRAM

SOIC−8

D SUFFIX

CASE 751

026A

ALYW

The Modulus Control (MC) selects the proper divide number after

SW has been biased to select the desired divide ratio.

Features

• 1.1 GHz Toggle Frequency

= Assembly Location

= Wafer Lot

= Year

= Work Week

= Pb−Free Package

• Supply Voltage 4.5 to 5.5 V

• Low Power 4.0 mA Typical

• Operating Temperature Range of −40 to 85°C

• The MC12026 is Pin Compatible with the MC12022

• Short Setup Time (t ) 6.0 ns Typical @ 1.1 GHz

set

• Modulus Control Input Level is Compatible with Standard CMOS

and TTL

PIN CONNECTIONS

• Pb−Free Packages are Available

Table 1. FUNCTIONAL TABLE

Divide Ratio

GND

OUT

(Top View)

ORDERING INFORMATION

See detailed ordering and shipping information in the package

dimensions section on page 5 of this data sheet.

1. SW: H = V , L = Open. A logic L can also be applied by grounding this pin,

but this is not recommended due to increased power consumption.

2. MC: H = 2.0 V to V , L = GND to 0.8 V.

Table 2. MAXIMUM RATINGS

Characteristics

Power Supply Voltage, Pin 2

Operating Temperature Range

Storage Temperature Range

Modulus Control Input, Pin 6

Maximum Output Current, Pin 4

Symbol

Value

−0.5 to 7.0

−40 to 85

−65 to 150

−0.5 to 6.5

10.0

Unit

Vdc

°C

stg

°C

Vdc

Maximum ratings are those values beyond which device damage can occur.

Maximum ratings applied to the device are individual stress limit values (not

normal operating conditions) and are not valid simultaneously. If these limits are

exceeded, device functional operation is not implied, damage may occur and

reliability may be affected.

NOTE: ESD data available upon request.

Semiconductor Components Industries, LLC, 2006

Publication Order Number:

January, 2006 − Rev. 8

MC12026A/D

12 3 4 5 6

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