LMV112
SNAS297B –MAY 2005–REVISED MAY 2013
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2.7V ELECTRICAL CHARACTERISTICS (continued)
Unless otherwise specified, all limits are specified for TJ = 25°C, VDD = 2.7V, VSS = 0V, VCM = 1V, Enable1,2 = VDD, CL = 20 pF,
RL = 30 kΩ, CCOUPLING = 1 nF. Boldface limits apply at temperature range extremes of operating condition. See (1)
.
Symbol
ISC
Parameter
Conditions
Min(2)
Typ(3)
Max(2)
Units
(6)
Output Short-Circuit Current
Sourcing
Sinking
−18
−13
−27
mA
20
30
16
Ven_hmin
Ven_lmax
Enable High Active Minimum Voltage
Enable Low Inactive Maximum Voltage
1.2
0.6
V
(6) Short-Circuit test is a momentary test. Continuous short circuit operation at elevated ambient temperature can result in exceeding the
maximum allowed junction temperature of 150°C.
5V ELECTRICAL CHARACTERISTICS
Unless otherwise specified, all limits are specified for TJ = 25°C, VDD = 5V, VSS = 0V, VCM = 1V, Enable1,2 = VDD, CL = 20 pF,
(1)
RL = 30 kΩ, CCOUPLING = 1 nF. Boldface limits apply at temperature range extremes of operating condition. See
.
Symbol
Parameter
Conditions
Min(2)
Typ(3)
Max(2)
Units
Frequency Domain Response
SSBW
FPBW
GFN
Small Signal Bandwidth
Full Power Bandwidth
Gain Flatness < 0.1 dB
VIN = 0.63 VPP; −3 dB
42
31
MHz
MHz
MHz
VIN = 1.6 VPP; −3 dB
f > 100 kHz
4.9
Distortion and Noise Performance
en
Input-Referred Voltage Noise
Output to Input
f = 1 MHz
27
90
61
nV/√Hz
dB
ISOLATION
CT
f = 1 MHz
Crosstalk Rejection
f = 26 MHz, PIN = 0 dBm
dB
Time Domain Response
tr
Rise Time
0.1 VPP Step (10-90%), f = 1 MHz
7
6
ns
ns
tf
Fall Time
ts
Settling Time to 0.1%
Overshoot
1 VPP Step, f = 1 MHz
0.1VPP Step, f = 1 MHz
VIN = 1.6 VPP, f = 26 MHz
80
20
120
ns
OS
SR
%
(4)
Slew Rate
V/µs
Static DC Performance
IS
Supply Current
Enable1,2 = VDD ; No Load
Enable1,2 = VSS ; No Load
DC (3.0V to 5.0V)
3.5
3.8
2.5
62
mA
μA
80
89
PSRR
ACL
Power Supply Rejection Ratio
Small Signal Voltage Gain
58
57
68
dB
VOUT = 0.1 VPP
0.99
0.97
1.01
1.03
1.00
1.3
3
V/V
mV
VOS
Output Offset Voltage
16
17
TC VOS
ROUT
Temperature Coefficient Output Offset
µV/°C
(5)
Voltage
Output Resistance
f = 100 kHz
f = 26 MHz
0.5
Ω
118
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that TJ = TA
.
(2) All limits are specified by testing or statistical analysis.
(3) Typical Values represent the most likely parametric norm.
(4) Slew rate is the average of the positive and negative slew rate.
(5) Average Temperature Coefficient is determined by dividing the changing in a parameter at temperature extremes by the total
temperature change.
4
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