Datasheet > LKT

LKT

更新时间： 2022-04-12 11:53:29

品牌	Logo	应用领域
KINGTRONICS		电容器陶瓷电容器
页数	文件大小	规格书
8页	365K
描述
Low Voltage Multilayer Chip Ceramic Capacitor

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数据手册

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LKT 数据手册

Website: www.kingtronics.com

Email: info@kingtronics.com Tel: (852) 8106 7033 Fax: (852) 8106 7099

LKT

Low Voltage Multilayer Chip Ceramic

Capacitor

14. Moisture Resistance ,steady state

Dielectrics

Specification

Testing Condition

No remarkable visual damage

Cp change within ±5% or ±0.5pF,

whichever is larger.

Cp<10pF, Q≥200+10Cp;

IO≤Cp<30pF, Q≥275+2.5Cp

Cp≥30pF, Q≥350

R*C≥1000MΩ or 50Ω·F, whichever is

smaller

Cp change within ±12.5%

DF: Not more than 2 times of initial value

R*C≥1000MΩ or 50Ω·F, whichever is

smaller

No remarkable visual damage

Cp change within ±30%

DF: Not more than 1.5 times of

initial value

R*C≥1000MΩ or 50Ω·F, whichever is

smaller

Test temperature: 40±2℃

Humidity: 90~95% RH

Testing time: 500 ±12hrs

NPO

Measurement to be made after being kept at room

temperature for 24±2hrs (COG) or 48±4hrs (X7R, X5R,

Y5V)

X7R/X5R

Y5V

*Initial measurement for high dielectric constant type

Perform a heat treatment at 140~150℃ for 1hr and let sit

for 48±4hrs at room temperature.

Perform the initial measurement.

15. Damp heat with load

Dielectrics

Specification

Testing Condition

No remarkable visual damage

Cp change≤±7.5% or ±0.75pF, whichever

is larger.

NPO

Cp<30pF, Q≥100+10/3*Cp

Cp≥30pF, Q≥200

Test temperature: 40±2℃

Humidity: 90~95% RH

Voltage: 100% of the rated voltage

Testing time: 500 ±12hrs

R*C≥500MΩ or 25Ω·F, whichever is

smaller

No remarkable visual damage

Cp change≤±12.5%

DF: Not more than 2 times of initial value

R*C≥500MΩ or 25Ω·F, whichever is

smaller

No remarkable visual damage

Cp change≤±30%

DF: Not more than 1.5 times of

initial value

R*C≥500MΩ or 25Ω·F , whichever is

smaller

Measurement to be made after being kept at room

temperature for 24±2hrs (COG) or 48±4hrs (X7R, X5R,

Y5V)

X7R/X5R

Y5V

*Apply the rated DC voltage for 1 hour at 40±2℃.

Remove and let sit for 48±4hrs at room temperature.

Perform the initial measurement.

16. Life Test

Dielectrics

Specification

Testing Condition

No remarkable visual damage

Cp change≤±3% or ±0.3pF, whichever is

larger.

Q≥350 (Cp≥30 PF)

Q≥275+(2.5* Cp) (10 pF≤Cp<30 PF)

Q≥200+10*Cp (Cp<10 PF)

R*C≥1000MΩ or 50Ω·F, whichever is smaller

No remarkable visual damage

Cp change≤±12.5%

DF:Not more than 2 times of initial value

R*C≥1000MΩ or 50Ω·F, whichever is smaller

Test temperature:

Max. Operating Temp. ±3℃

Voltage:

200% of the rated voltage

Testing time: 1000 hrs

NPO

Measurement to be made after being kept at room temperature

for 24±2hrs (COG) or 48±4hrs (X7R, X5R,Y5V)

X7R/X5R

Y5V

*Initial measurement for high dielectric constant type

Apply 200% of the rated DC voltage for one hour at the

maximum operating temperature ±3℃.

Remove and let sit for 48±4hrs at room temperature.

Perform the initial measurement

No remarkable visual damage

Cp change≤±30%

DF:Not more than 1.5 times of

initial value

R*C≥1000MΩ or 50Ω·F, whichever is smaller

1...3 4 567 8

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