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LF298MX PDF预览

LF298MX

更新时间: 2024-01-17 22:41:47
品牌 Logo 应用领域
美国国家半导体 - NSC 放大器光电二极管
页数 文件大小 规格书
13页 519K
描述
IC SAMPLE AND HOLD AMPLIFIER, 20 us ACQUISITION TIME, PDSO14, SOIC-14, Sample and Hold Circuit

LF298MX 技术参数

生命周期:Not Recommended零件包装代码:SOIC
包装说明:SOP-14针数:14
Reach Compliance Code:not_compliantECCN代码:EAR99
HTS代码:8542.39.00.01风险等级:5.13
最长采集时间:25 µs标称采集时间:20 µs
放大器类型:SAMPLE AND HOLD CIRCUIT最大模拟输入电压:11.5 V
最小模拟输入电压:-11.5 VJESD-30 代码:R-PDSO-G14
JESD-609代码:e0长度:8.6235 mm
湿度敏感等级:1负供电电压上限:-18 V
标称负供电电压 (Vsup):-15 V功能数量:1
端子数量:14最高工作温度:85 °C
最低工作温度:-25 °C封装主体材料:PLASTIC/EPOXY
封装代码:SOP封装等效代码:SOP14,.25
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
包装方法:TR峰值回流温度(摄氏度):235
电源:+-15 V认证状态:Not Qualified
采样并保持/跟踪并保持:SAMPLE座面最大高度:1.753 mm
子类别:Sample and Hold Circuit最大压摆率:5.5 mA
供电电压上限:18 V标称供电电压 (Vsup):15 V
表面贴装:YES技术:BIPOLAR
温度等级:OTHER端子面层:Tin/Lead (Sn/Pb)
端子形式:GULL WING端子节距:1.27 mm
端子位置:DUAL处于峰值回流温度下的最长时间:30
宽度:3.9 mmBase Number Matches:1

LF298MX 数据手册

 浏览型号LF298MX的Datasheet PDF文件第4页浏览型号LF298MX的Datasheet PDF文件第5页浏览型号LF298MX的Datasheet PDF文件第6页浏览型号LF298MX的Datasheet PDF文件第8页浏览型号LF298MX的Datasheet PDF文件第9页浏览型号LF298MX的Datasheet PDF文件第10页 
Application Hints (Continued)  
Guarding Technique  
logic input for signal delay, calculate the slope of the wave-  
form at the threshold point to ensure that it is at least  
1.0 V/µs.  
Sampling Dynamic Signals  
Sample error to moving input signals probably causes more  
confusion among sample-and-hold users than any other pa-  
rameter. The primary reason for this is that many users make  
the assumption that the sample and hold amplifier is truly  
locked on to the input signal while in the sample mode. In ac-  
tuality, there are finite phase delays through the circuit creat-  
ing an input-output differential for fast moving signals. In ad-  
dition, although the output may have settled, the hold  
capacitor has an additional lag due to the 300series resis-  
tor on the chip. This means that at the moment the “hold”  
command arrives, the hold capacitor voltage may be some-  
what different than the actual analog input. The effect of  
these delays is opposite to the effect created by delays in the  
logic which switches the circuit from sample to hold. For ex-  
ample, consider an analog input of 20 Vp-p at 10 kHz. Maxi-  
mum dV/dt is 0.6 V/µs. With no analog phase delay and 100  
ns logic delay, one could expect up to (0.1 µs) (0.6V/µs)  
= 60 mVerror if the “hold” signal arrived near maximum dV/dt  
of the input. A positive-going input would give a +60 mV er-  
ror. Now assume a 1 MHz (3 dB) bandwidth for the overall  
analog loop. This generates a phase delay of 160 ns. If the  
hold capacitor sees this exact delay, then error due to analog  
delay will be (0.16 µs) (0.6 V/µs) = −96 mV. Total output error  
is +60 mV (digital) −96 mV (analog) for a total of −36 mV. To  
add to the confusion, analog delay is proportioned to hold  
capacitor value while digital delay remains constant. A family  
of curves (dynamic sampling error) is included to help esti-  
mate errors.  
DS005692-5  
Use 10-pin layout. Guard around Chis tied to output.  
A curve labeled Aperture Time has been included for sam-  
pling conditions where the input is steady during the sam-  
pling period, but may experience a sudden change nearly  
coincident with the “hold” command. This curve is based on  
a 1 mV error fed into the output.  
A second curve, Hold Settling Time indicates the time re-  
quired for the output to settle to 1 mV after the “hold” com-  
mand.  
Digital Feedthrough  
Fast rise time logic signals can cause hold errors by feeding  
externally into the analog input at the same time the amplifier  
is put into the hold mode. To minimize this problem, board  
layout should keep logic lines as far as possible from the  
analog input and the Ch pin. Grounded guarding traces may  
also be used around the input line, especially if it is driven  
from a high impedance source. Reducing high amplitude  
logic signals to 2.5V will also help.  
7
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