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LB11685AV

更新时间： 2024-09-25 12:36:31
品牌 Logo 应用领域
安森美 - ONSEMI 驱动器传感器电机
页数 文件大小 规格书
7页 113K
描述
3-phase sensor less Motor driver

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LB11685AV 数据手册

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Ordering number : ENA1772A  
LB11685AV  
Monolithic Digital IC  
3-phase sensor less  
Motor driver  
http://onsemi.com  
Overview  
The LB11685AV is a three-phase full-wave current-linear-drive motor driver IC. It adopts a sensor less control system  
without the use of a Hall Effect device. For quieter operation, the LB11685AV features a current soft switching circuit  
and be optimal for driving the cooling fan motors used in refrigerators, etc.  
Functions  
• Three-phase full-wave linear drive (Hall sensor-less method)  
• Built-in three-phase output voltage control circuit  
• Motor lock protection detection output  
• Built-in current limiter circuit  
• Built-in motor lock protection circuit  
• FG output made by back EMF  
• Beat lock prevention circuit  
• Built-in thermal shut down circuit  
Specifications  
Maximum Ratings at Ta = 25°C  
Parameter  
Maximum supply voltage  
Input applied voltage  
Symbol  
Conditions  
Ratings  
Unit  
V
V
V
I
max  
19  
CC  
max  
-0.3 to V  
CC  
+0.3  
1.2  
V
IN  
max *1  
Maximum output current  
Allowable power dissipation  
Operating temperature  
Storage temperature  
A
O
Pd max  
Topr  
Mounted on a board *2  
1.05  
W
°C  
°C  
°C  
-40 to 85  
-55 to 150  
150  
Tstg  
Junction temperature  
Tj max  
*1: The I is a peak value of motor-current.  
O
*2: Specified board: 76.1mm × 114.3mm × 1.6mm, glass epoxy board.  
Caution 1) Absolute maximum ratings represent the value which cannot be exceeded for any length of time.  
Caution 2) Even when the device is used within the range of absolute maximum ratings, as a result of continuous usage under high temperature, high current,  
high voltage, or drastic temperature change, the reliability of the IC may be degraded. Please contact us for the further details.  
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating  
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.  
Semiconductor Components Industries, LLC, 2013  
May, 2013  
71812 SY/61610 SY 20100604-S00001 No.A1772-1/7  
1234567

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