JJV05D Series
JieJie Semiconductor Co., Ltd
RELIABILITY TESTS ‐ Environmental ratings
Condition
The specimen shall be applied continuously the maximum allowable
Requirements
Parameter
voltage at the specified conditions for specified period and then stored at
room temperature and normal humidity over 2 hours. Thereafter the
change of VB and mechanical damage shall be examined.
Dry Heat
Loading
∆VB/VB%≤±10%
∆VB/VB%≤±5%
∆VB/VB%≤±10%
Ambient temp.: 125±2℃; Period: 1000±24hours.
High
In a drying oven without load.
Temperature
Storage
Ambient temp.: 125±2℃; period: 1000±24hours
The specimen shall be applied continuously the maximum allowable voltage
at the specified conditions for specified period and then stored at room
temperature and normal humidity over 2 hours. Thereafter, the change of VB
and mechanical damage shall be examined.
Damp Heat
Loading
Ambient condition: 40±2℃, 90 to 95%R.H.; period: 1000±24 hours
Condition the specimen to each
temperature form step 1 to step 4 in
this order for the period shown in
the table of specifications. The
change of VB and mechanical
damage shall be examined after 2
hours.
Step
Temp(℃)
-40±3℃
Period
30 min.
15 min.
30 min.
15 min.
1
2
3
4
Temperature
Cycle
No visible damage
Room Temp.
85±2℃
∆VB/VB%≤±10%
Room Temp.
Surge
Lifetime
Rating
Voltage
Proof
The change of VB shall be measured after the impulse listed below is
applied 10,000 times continuously with the interval of ten seconds at room
temperature.
No visible damage
∆VB/VB%≤±10%
Voltage: 2500 VAC; Leakage current≤0.5mA; Time: 60 Seconds
No breakdown
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