J-Type Voltage Controlled Crystal Oscillator
Qualification Conformance
The CMOS J-type family has undergone the following Mil-Std qualification:
Table 3. Environmental Compliance
Parameter
Conditions
Mechanical Shock
Mechanical Vibration
Solderability
Gross and Fine Leak
Resistance to Solvents
MIL-STD-883, Method 2002
MIL-STD-883, Method 2007
MIL-STD-883, Method 2003
MIL-STD-883, Method 1014
MIL-STD-883, Method 2015
Handling Precautions
Although ESD protection circuitry has been designed into the the J-type, proper precautions should be
taken when handling and mounting. VI employs a human body model and a charged-device model
(CDM) for ESD susceptibility testing and design protection evaluation. ESD thresholds are dependent on
the circuit parameters used to define the model. Although no industry wide standard has been adopted
for the CDM, a standard HBM of resistance = 1.5Kohms and capacitance = 100pF is widely used and
therefore can be used for comparison purposes.
Table 4. ESD Ratings
Model
Minimum
1500 V
1500 V
Human Body Model (HBM)
Charged Device Model (CDM)
Reflow Profile (IPC/JEDEC J-STD-020C)
Parameter
Symbol
Value
PreHeat Time
t S
60 sec Min, 180 sec Max
3 oC/sec Max
Ramp Up
R UP
t L
Time Above 217 oC
Time To Peak Temperature
Time At 260 oC
60 sec Min, 150 sec Max
480 sec Max
t AMB-P
t P
20 sec Min, 40 sec Max
6 oC/sec Max
Ramp Down
R DN
t L
t P
260
R UP
217
200
R DN
150
t S
t AMB-P
25
Time (sec)
Vectron International 267 Lowell Rd. Hudson, NH 03051 Tel:1-88-VECTRON-1
e-mail vectron@vectron.com
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